Patents by Inventor Abidin G. Onaran

Abidin G. Onaran has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Methods of imaging in probe microscopy
    Patent number: 7441447
    Abstract: In accordance with an embodiment of the invention, there is a force sensor for a probe based instrument. The force sensor can comprise a detection surface and a flexible mechanical structure disposed a first distance above the detection surface so as to form a gap between the flexible mechanical structure and the detection surface, wherein the flexible mechanical structure is configured to deflect upon exposure to an external force, thereby changing the first distance.
    Type: Grant
    Filed: October 10, 2006
    Date of Patent: October 28, 2008
    Assignee: Georgia Tech Research Corporation
    Inventors: Fahrettin L. Degertekin, Abidin G. Onaran, Mujdat Balantekin