Patents by Inventor Abir Zahalka

Abir Zahalka has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6385332
    Abstract: An ultrasound segmentation method comprising the steps of automated initial contour identification, followed by application of a geometrically deformable model (GDM). The formation of the initial contours involves the input of a single seed point by the user, and has been found to be insensitive to the placement of the seed within a structure. The GDM minimizes contour energy, providing a smoothed final result, with only three simple parameters being required as easily selectable input values.
    Type: Grant
    Filed: February 19, 1999
    Date of Patent: May 7, 2002
    Assignee: The John P. Roberts Research Institute
    Inventors: Abir Zahalka, Aaron Fenster