Abstract: A test system has a package containing a number of die. There is a JTAG controller for each of the die. There is also master/slave selector input for each of the JTAG controllers. A boundary scan register link connects at least two of the die.

Abstract: An apparatus comprising one or more stations. Each of the one or more stations may be configured to receive a signal from a communication channel. The signal generally comprising event detection information. The one or more stations may be configured to share the event detection information.

Abstract: An apparatus comprising a memory section and a first circuit. The memory section may be configured to present a first output in response to (i) a first clock signal, (ii) a second clock signal, (iii) an input pulse and (iv) the first output. The first circuit may be configured to generate a second output in response to (i) the first output and (ii) the second clock signal, where the second output may comprise a pulse having a width equal to a period of the second clock signal. In one example, an input circuit may be configured to present the first output to the memory section in response to the input pulse and a first feedback of the output.