Patents by Inventor Abraham Ben-Har

Abraham Ben-Har has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for analyzing cuts
    Patent number: 6192289
    Abstract: A system for analyzing the quality of the sawing of a material which includes a scanning unit, a cut parameter identifier and a cut analyzer. The scanning unit scans along cuts of the material and views at least a portion of a cut. The cut parameter identifier identifies and stores parameters of the viewed cut portion. The cut analyzer analyzes the parameters of a multiplicity of viewed cut portions and which determines the quality of the cuts therefrom.
    Type: Grant
    Filed: February 13, 1998
    Date of Patent: February 20, 2001
    Assignee: Inspectech Ltd.
    Inventors: Michael Geffen, Abraham Ben-Har