Patents by Inventor Abraham SALDIVAR-VALDES

Abraham SALDIVAR-VALDES has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11257978
    Abstract: A photovoltaic device and a method of forming a contact stack of the photovoltaic device are disclosed. The photovoltaic device may include a first layer deposited on a semiconductor layer including a compound semiconductor material. The photovoltaic device may also include a dopant layer comprising tin (Sn) deposited on the first layer. The photovoltaic device may further include a conductive layer deposited or provided over the dopant layer to form a contact stack with the first layer and the dopant layer.
    Type: Grant
    Filed: March 29, 2019
    Date of Patent: February 22, 2022
    Assignee: UTICA LEASECO, LLC
    Inventors: Abraham Saldivar-Valdes, Octavi Santiago Escala Semonin
  • Publication number: 20200313007
    Abstract: A photovoltaic device and a method of forming a contact stack of the photovoltaic device are disclosed. The photovoltaic device may include a first layer deposited on a semiconductor layer including a compound semiconductor material. The photovoltaic device may also include a dopant layer comprising tin (Sn) deposited on the first layer. The photovoltaic device may further include a conductive layer deposited or provided over the dopant layer to form a contact stack with the first layer and the dopant layer.
    Type: Application
    Filed: March 29, 2019
    Publication date: October 1, 2020
    Inventors: Abraham SALDIVAR-VALDES, Octavi Santiago Escala SEMONIN
  • Publication number: 20200286765
    Abstract: Aspects of the present disclosure include methods, apparatuses, and computer readable media for emitting an incident light toward a semiconductor layer of a semiconductor device, wherein the incident light is a sub-bandgap light substantially transparent to the semiconductor layer, detecting a reflected light generated from the incident light penetrating through the semiconductor layer of the semiconductor device and reflecting off of a portion of the semiconductor device, identifying a macroscopic feature underneath the semiconductor layer based on the reflected light, wherein the macroscopic feature corresponds to the portion of the semiconductor device and is visible to the naked eye, and performing an alignment procedure by using the identified macroscopic feature as a reference for the alignment procedure.
    Type: Application
    Filed: March 5, 2020
    Publication date: September 10, 2020
    Inventors: Borirak OPASANONT, Abraham SALDIVAR-VALDES, Daniel G. PATTERSON