Patents by Inventor Achim Kirsch

Achim Kirsch has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7903862
    Abstract: A method for detecting geometrical structures in images, especially in images of chemical and/or biological samples, such as images of cells, the method comprising the following steps: detecting a boundary line of the image object; defining at least one sector inside the image, the origin (pk) of which lies on the boundary line; transforming the image section defined by the sector into a transformation space by means of a transformation that associates signatures in the transformation space with respective geometrical structures in the image section; determining the presence of at least one signature inside the transformation space; and retransforming the signatures from the transformation space into the sector for the representation of the geometrical structure.
    Type: Grant
    Filed: July 8, 2005
    Date of Patent: March 8, 2011
    Assignee: Evotec Technologies GmbH
    Inventors: Achim Kirsch, Fritz Jetzek
  • Patent number: 7474777
    Abstract: An optical measurement device for measurement of chemical and/or biological samples comprises an illumination means (16) for illuminating the sample (20) to be measured. Further, an optics means (22) is provided for imaging a sample area in an image field (10). A first partial area (12) of the image field is covered by a first detector (28), and a second partial area (14) of the image field (10) is covered by a second detector (34). Thus, it is possible to change between two measurement methods without switching or to perform two measurements on a sample at the same time.
    Type: Grant
    Filed: April 26, 2002
    Date of Patent: January 6, 2009
    Assignee: Evotec Oai AG
    Inventors: Achim Kirsch, Roland Stange, Jürgen Müller
  • Patent number: 7376256
    Abstract: A method for analyzing chemical and/or biological samples comprises the production of a particle image (42) of at least one particle included in the sample. Subsequently, a particle surface (10) of the at least one particle included in the particle image (42) is divided into particle zones (14,18). According to the invention, zone-dependent particle data are subsequently acquired in different states (z1, z2, z3), which then can be evaluated.
    Type: Grant
    Filed: April 16, 2003
    Date of Patent: May 20, 2008
    Assignee: Evotec Oai AG
    Inventors: Achim Kirsch, Olavi Ollikainen
  • Publication number: 20070263917
    Abstract: A method for detecting geometrical structures in images, especially in images of chemical and/or biological samples, such as images of cells, the method comprising the following steps: detecting a boundary line of the image object; defining at least one sector inside the image, the origin (pk) of which lies on the boundary line; transforming the image section defined by the sector into a transformation space by means of a transformation that associates signatures in the transformation space with respective geometrical structures in the image section; determining the presence of at least one signature inside the transformation space; and retransforming the signatures from the transformation space into the sector for the representation of the geometrical structure.
    Type: Application
    Filed: July 8, 2005
    Publication date: November 15, 2007
    Applicant: Evotec Technologies GmbH
    Inventors: Achim Kirsch, Fritz Jetzek
  • Publication number: 20040257576
    Abstract: An optical measurement device for measurement of chemical and/or biological samples comprises an illumination means (16) for illuminating the sample (20) to be measured. Further, an optics means (22) is provided for imaging a sample area in an image field (10). A first partial area (12) of the image field is covered by a first detector (28), and a second partial area (14) of the image field (10) is covered by a second detector (34). Thus, it is possible to change between two measurement methods without switching or to perform two measurements on a sample at the same time.
    Type: Application
    Filed: August 12, 2004
    Publication date: December 23, 2004
    Inventors: Achim Kirsch, Roland Stange, Jurgen Muller
  • Publication number: 20040248191
    Abstract: A method for analyzing chemical and/or biological samples comprises the production of a particle image (42) of at least one particle included in the sample. Subsequently, a particle surface (10) of the at least one particle included in the particle image (42) is divided into particle zones (14,18). According to the invention, zone-dependent particle data are subsequently acquired in different states (z1, z2, z3), which then can be evaluated.
    Type: Application
    Filed: July 27, 2004
    Publication date: December 9, 2004
    Inventors: Achim Kirsch, Olavi Ollikainen
  • Patent number: RE44555
    Abstract: A method for analyzing chemical and/or biological samples comprises the production of a particle image (42) of at least one particle included in the sample. Subsequently, a particle surface (10) of the at least one particle included in the particle image (42) is divided into particle zones (14,18). According to the invention, zone-dependent particle data are subsequently acquired in different states (z1, z2, z3), which then can be evaluated.
    Type: Grant
    Filed: August 4, 2008
    Date of Patent: October 22, 2013
    Assignee: Evotec AG
    Inventors: Achim Kirsch, Olavi Ollikainen