Patents by Inventor Adam Browen

Adam Browen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20080276133
    Abstract: A system, device and method are described that provide dynamic calibration of high-speed systems, such as high-speed DDR memory systems. In accordance with certain embodiments of the invention, a DDR controller includes functionality that both initializes settings associated with a data window and dynamically maintains the data window within a defined threshold of operation. In various embodiments, an initial calibration module is provided on the DDR controller for performing a full calibration wherein a data window is initially generated and a center point of the data window is established within a specified threshold. Interrupts may be generated to evaluate the data window and center point and/or recalibrate the data window and center point in response to the evaluation or an interrupt generated from another source, such as a system error or user generated interrupt. If a timer expiration interrupt occurs, the data window and its center point are re-evaluated.
    Type: Application
    Filed: May 2, 2007
    Publication date: November 6, 2008
    Inventors: Andrew Hadley, Stuart Nuffer, Adam Browen
  • Publication number: 20070112544
    Abstract: An apparatus and a method for analyzing signals within an integrated circuit are described. In one embodiment of the present invention, internal IC signals are tapped, sampled and stored according to one or more sampling criteria. The signals may be taken from multiple locations within the IC and the information stored may include data, timing information, control data and other such information related to the tapped signals. The stored information may be provided to an external device for analysis.
    Type: Application
    Filed: November 16, 2005
    Publication date: May 17, 2007
    Inventors: Adam Browen, Craig Chafin, Jeffery Whitt, Steve Olson
  • Patent number: 6633832
    Abstract: An improved PCI-X verification method and apparatus provides iterative testing of all desired conditions or protocol combinations in a PCI-X system. One or more commands may be tested in combination with one or more functional behavior parameters throughout a desired range of variable parameter values. In one aspect, an apparatus and method for testing a PCI-X device for compliance under the PCI-X Addendum to the PCI Local Bus Specification in completer operation are provided. In another aspect, an apparatus and method for testing a PCI-X-device for compliance under the PCI-X addendum to the PCI Local Bus Specification in requester operation are provided.
    Type: Grant
    Filed: February 28, 2001
    Date of Patent: October 14, 2003
    Assignee: LSI Logic Corporation
    Inventor: Adam Browen
  • Patent number: 6587813
    Abstract: An improved PCI verification method and apparatus provides iterative testing of all desired conditions or protocol combinations in a PCI system. One or more commands may be tested in combination with one or more functional behavior parameters throughout a desired range of variable parameter values. In one aspect, an apparatus and method for testing a PCI device for compliance under the PCI specification in target operation is provided. In another aspect, an apparatus and method for testing a PCI device for compliance under the PCI specification in master operation is provided.
    Type: Grant
    Filed: April 11, 2000
    Date of Patent: July 1, 2003
    Assignee: LSI Logic Corporation
    Inventors: Jeffrey K. Whitt, David So, Stuart Nuffer, Erik Paulsen, John Grabarek, Andrew Hadley, William Schmitz, Adam Browen