Patents by Inventor Adam Erlich

Adam Erlich has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11988844
    Abstract: Metasurface elements, integrated systems incorporating such metasurface elements with light sources and/or detectors, and methods of the manufacture and operation of such optical arrangements and integrated systems are provided. Systems and methods for integrating transmissive metasurfaces with other semiconductor devices or additional metasurface elements, and more particularly to the integration of such metasurfaces with substrates, illumination sources and sensors are also provided. The metasurface elements provided may be used to shape output light from an illumination source or collect light reflected from a scene to form two unique patterns using the polarization of light. In such embodiments, shaped-emission and collection may be combined into a single co-designed probing and sensing optical system.
    Type: Grant
    Filed: May 13, 2020
    Date of Patent: May 21, 2024
    Assignee: Metalenz, Inc.
    Inventors: Gilbert N. Riley, Jr., Robert Devlin, Adam Erlich, Pawel Latawiec, John Graff
  • Publication number: 20230194883
    Abstract: Metasurface elements, integrated systems incorporating such metasurface elements with light sources and/or detectors, and methods of the manufacture and operation of such optical arrangements and integrated systems are provided. Systems and methods for integrating transmissive metasurfaces with other semiconductor devices or additional metasurface elements, and more particularly to the integration of such metasurfaces with substrates, illumination sources and sensors are also provided. The metasurface elements provided may be used to shape output light from an illumination source or collect light reflected from a scene to form two unique patterns using the polarization of light. In such embodiments, shaped-emission and collection may be combined into a single co-designed probing and sensing optical system.
    Type: Application
    Filed: February 13, 2023
    Publication date: June 22, 2023
    Applicant: Metalenz, Inc.
    Inventors: Gilbert N. Riley, JR., Robert Devlin, Adam Erlich, Pawel Latawiec, John Graff
  • Patent number: 11579456
    Abstract: Metasurface elements, integrated systems incorporating such metasurface elements with light sources and/or detectors, and methods of the manufacture and operation of such optical arrangements and integrated systems are provided. Systems and methods for integrating transmissive metasurfaces with other semiconductor devices or additional metasurface elements, and more particularly to the integration of such metasurfaces with substrates, illumination sources and sensors are also provided. The metasurface elements provided may be used to shape output light from an illumination source or collect light reflected from a scene to form two unique patterns using the polarization of light. In such embodiments, shaped-emission and collection may be combined into a single co-designed probing and sensing optical system.
    Type: Grant
    Filed: December 7, 2021
    Date of Patent: February 14, 2023
    Assignee: Metalenz, Inc.
    Inventors: Gilbert N. Riley, Jr., Robert Devlin, Adam Erlich, Pawel Latawiec, John Graff
  • Publication number: 20220091428
    Abstract: Metasurface elements, integrated systems incorporating such metasurface elements with light sources and/or detectors, and methods of the manufacture and operation of such optical arrangements and integrated systems are provided. Systems and methods for integrating transmissive metasurfaces with other semiconductor devices or additional metasurface elements, and more particularly to the integration of such metasurfaces with substrates, illumination sources and sensors are also provided. The metasurface elements provided may be used to shape output light from an illumination source or collect light reflected from a scene to form two unique patterns using the polarization of light. In such embodiments, shaped-emission and collection may be combined into a single co-designed probing and sensing optical system.
    Type: Application
    Filed: December 7, 2021
    Publication date: March 24, 2022
    Applicant: Metalenz, Inc.
    Inventors: Gilbert N. Riley, JR., Robert Devlin, Adam Erlich, Pawel Latawiec, John Graff
  • Patent number: 10795168
    Abstract: Metasurface elements, integrated systems incorporating such metasurface elements with light sources and/or detectors, and methods of the manufacture and operation of such optical arrangements and integrated systems are provided. Systems and methods for integrating transmissive metasurfaces with other semiconductor devices or additional metasurface elements, and more particularly to the integration of such metasurfaces with substrates, illumination sources and sensors are also provided. The metasurface elements provided may be used to shape output light from an illumination source or collect light reflected from a scene to form two unique patterns using the polarization of light. In such embodiments, shaped-emission and collection may be combined into a single co-designed probing and sensing optical system.
    Type: Grant
    Filed: August 31, 2018
    Date of Patent: October 6, 2020
    Assignee: Metalenz, Inc.
    Inventors: Gilbert N. Riley, Jr., Robert Devlin, Adam Erlich, Pawel Latawiec, John Graff
  • Publication number: 20200271941
    Abstract: Metasurface elements, integrated systems incorporating such metasurface elements with light sources and/or detectors, and methods of the manufacture and operation of such optical arrangements and integrated systems are provided. Systems and methods for integrating transmissive metasurfaces with other semiconductor devices or additional metasurface elements, and more particularly to the integration of such metasurfaces with substrates, illumination sources and sensors are also provided. The metasurface elements provided may be used to shape output light from an illumination source or collect light reflected from a scene to form two unique patterns using the polarization of light. In such embodiments, shaped-emission and collection may be combined into a single co-designed probing and sensing optical system.
    Type: Application
    Filed: May 13, 2020
    Publication date: August 27, 2020
    Applicant: Metalenz, Inc.
    Inventors: Gilbert N. Riley, JR., Robert Devlin, Adam Erlich, Pawel Latawiec, John Graff
  • Publication number: 20190064532
    Abstract: Metasurface elements, integrated systems incorporating such metasurface elements with light sources and/or detectors, and methods of the manufacture and operation of such optical arrangements and integrated systems are provided. Systems and methods for integrating transmissive metasurfaces with other semiconductor devices or additional metasurface elements, and more particularly to the integration of such metasurfaces with substrates, illumination sources and sensors are also provided. The metasurface elements provided may be used to shape output light from an illumination source or collect light reflected from a scene to form two unique patterns using the polarization of light. In such embodiments, shaped-emission and collection may be combined into a single co-designed probing and sensing optical system.
    Type: Application
    Filed: August 31, 2018
    Publication date: February 28, 2019
    Applicant: Metalenz, Inc.
    Inventors: Gilbert N. Riley, JR., Robert Devlin, Adam Erlich, Pawel Latawiec, John Graff
  • Publication number: 20120033220
    Abstract: A spectroscopy system comprising at least two laser modules, each of the laser modules including a laser cavity, a quantum cascade gain chip for amplifying light within the laser cavity, and a tuning element for controlling a wavelength of light generated by the modules. Combining optics are used to combine the light generated by the at least two laser modules into a single beam and a sample detector detects the single beam returning from a sample.
    Type: Application
    Filed: June 13, 2011
    Publication date: February 9, 2012
    Applicant: BLOCK ENGINEERING, LLC
    Inventors: Petros Kotidis, Erik Deutsch, Ninghui Zhu, Adam Erlich, Dan Cavicchio, John Coates, John Heanue