Patents by Inventor Adam H. Hesselroth

Adam H. Hesselroth has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

Test method for determining microstructure deformation resistance of a microstructured film

Patent number: 7716999

Abstract: Test method for determining (e.g. prism) microstructure deformation of a microstructured (e.g. brightness enhancing) film are described.

Type: Grant

Filed: October 3, 2008

Date of Patent: May 18, 2010

Assignee: 3M Innovative Properties Company

Inventors: Adam H. Hesselroth, Stephen J Dreyer, Mark R. Dupre
TEST METHOD FOR DETERMINING MICROSTRUCTURE DEFORMATION RESISTANCE OF A MICROSTRUCTURED FILM

Publication number: 20090107261

Abstract: Test method for determining (e.g. prism) microstructure deformation of a microstructured (e.g. brightness enhancing) film are described.

Type: Application

Filed: October 3, 2008

Publication date: April 30, 2009

Inventors: Adam H. Hesselroth, Stephen J. Dreyer, Mark R. Dupre

Test method for determining microstructure deformation resistance of a microstructured film

TEST METHOD FOR DETERMINING MICROSTRUCTURE DEFORMATION RESISTANCE OF A MICROSTRUCTURED FILM