Patents by Inventor Adam J. Feinstein

Adam J. Feinstein has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for automatically loading a probe assembly
    Patent number: 9360498
    Abstract: The preferred embodiments are directed to a method of operating an SPM including providing probe cassette for a scanning probe microscope that includes a base having at least one probe storage receptacle, a lid mountable on the base with the probe storage receptacle at least substantially covering the at least one receptacle, and a probe retainer that retains a probe device of the scanning probe microscope in the receptacle under a compressive force. The probe cassette can be pre-loaded and shipped to a user site where the cassette can be loaded in an AFM without manual manipulation of the individual probe devices.
    Type: Grant
    Filed: March 22, 2011
    Date of Patent: June 7, 2016
    Assignee: Bruker Nano, Inc.
    Inventors: Adam J. Feinstein, Matthew R. Wilson, Timothy M. Cunningham
  • Method for Automatically Loading a Probe Assembly
    Publication number: 20110173729
    Abstract: The preferred embodiments are directed to a method of operating an SPM including providing probe cassette for a scanning probe microscope that includes a base having at least one probe storage receptacle, a lid mountable on the base with the probe storage receptacle at least substantially covering the at least one receptacle, and a probe retainer that retains a probe device of the scanning probe microscope in the receptacle under a compressive force. The probe cassette can be pre-loaded and shipped to a user site where the cassette can be loaded in an AFM without manual manipulation of the individual probe devices.
    Type: Application
    Filed: March 22, 2011
    Publication date: July 14, 2011
    Inventors: Adam J. Feinstein, Matthew R. Wilson
  • Apparatus and method of transporting and loading probe devices of a metrology instrument
    Patent number: 7908909
    Abstract: The preferred embodiments are directed to a probe cassette for a scanning probe microscope that includes a base having at least one probe storage receptacle, a lid mountable on the base with the probe storage receptacle at least substantially covering the at least one receptacle, and a probe retainer that retains a probe device of the scanning probe microscope in the receptacle under a compressive force. The probe cassette can be pre-loaded and shipped to a user site where the cassette can be loaded in an AFM without manual manipulation of the individual probe devices.
    Type: Grant
    Filed: March 31, 2008
    Date of Patent: March 22, 2011
    Assignee: Bruker Nano, Inc.
    Inventors: Adam J. Feinstein, Matthew R. Wilson
  • APPARATUS AND METHOD OF TRANSPORTING AND LOADING PROBE DEVICES OF A METROLOGY INSTRUMENT
    Publication number: 20080179206
    Abstract: The preferred embodiments are directed to a probe cassette for a scanning probe microscope that includes a base having at least one probe storage receptacle, a lid mountable on the base with the probe storage receptacle at least substantially covering the at least one receptacle, and a probe retainer that retains a probe device of the scanning probe microscope in the receptacle under a compressive force. The probe cassette can be pre-loaded and shipped to a user site where the cassette can be loaded in an AFM without manual manipulation of the individual probe devices.
    Type: Application
    Filed: March 31, 2008
    Publication date: July 31, 2008
    Applicant: Veeco Instruments Inc.
    Inventors: Adam J. Feinstein, Matthew R. Wilson