Patents by Inventor Adam J. SCHULTZ

Adam J. SCHULTZ has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • High voltage probe card system
    Patent number: 11275106
    Abstract: A test assembly for testing a device under test includes a probe card assembly and a cap secured to the probe card assembly. The probe card assembly includes a probe tile having a plurality of openings. The probe tile includes a plurality of probe wires including a probe needle portion and a probe tip portion. A seal is disposed on a surface of the probe tile and forms an outer perimeter of a pressurized area. The probe tile includes an insulation layer formed within the pressurized area that is configured to separate the probe needle portion from the device under test. The insulation layer includes an aperture through which the probe tip portion extends to contact the device under test. The cap includes a fluid inlet and a fluid return outlet that are in fluid communication with the plurality of openings of the probe tile.
    Type: Grant
    Filed: October 7, 2019
    Date of Patent: March 15, 2022
    Assignee: CELADON SYSTEMS, INC.
    Inventors: Adam J. Schultz, William A. Funk, Bryan J. Root
  • HIGH VOLTAGE PROBE CARD SYSTEM
    Publication number: 20200110126
    Abstract: A test assembly for testing a device under test includes a probe card assembly and a cap secured to the probe card assembly. The probe card assembly includes a probe tile having a plurality of openings. The probe tile includes a plurality of probe wires including a probe needle portion and a probe tip portion. A seal is disposed on a surface of the probe tile and forms an outer perimeter of a pressurized area. The probe tile includes an insulation layer formed within the pressurized area that is configured to separate the probe needle portion from the device under test. The insulation layer includes an aperture through which the probe tip portion extends to contact the device under test. The cap includes a fluid inlet and a fluid return outlet that are in fluid communication with the plurality of openings of the probe tile.
    Type: Application
    Filed: October 7, 2019
    Publication date: April 9, 2020
    Inventors: Adam J. SCHULTZ, William A. FUNK, Bryan J. ROOT