Abstract: An apparatus includes a transceiver configured to generate a signal and receive a plurality of reflected signals for measurement of a level of a process fluid in a tank. The apparatus also includes a waveguide comprising a probe and a buoyant part. The probe is configured to guide the signal from the transceiver and the plurality of reflected signals to the transceiver. The buoyant part is configured to move with the level of the process fluid at an end of the probe and produce a secondary signal representing the level of the process fluid when a level signal of the process fluid is within an end signal representing the end of the probe.

Abstract: A method of configuring an electronic level gauge (ELG) includes with an ELG configuration tool including a GUI having a user interface. A processor implements an enhancement algorithm and a simulator. A tank library includes a plurality of tank shapes. The user interface receives application configuration information including a selection of a tank shape, a mounting location for positioning the ELG, and at least one process detail. The simulator generates a calculated strength of a measurement signal reflected from a surface of material in the tank for at least one level. If the calculated strength is ? a predetermined strength, proper performance of the ELG is indicated, and if the calculated strength < the predetermined strength, the ELG configuration tool prompts a change in at least one application of the configuration information to be entered on the user interface, and the simulator then recalculates the calculated strength.

Abstract: An apparatus includes a transceiver configured to generate a signal and receive a plurality of reflected signals for measurement of a level of a process fluid in a tank. The apparatus also includes a waveguide comprising a probe and a buoyant part. The probe is configured to guide the signal from the transceiver and the plurality of reflected signals to the transceiver. The buoyant part is configured to move with the level of the process fluid at an end of the probe and produce a secondary signal representing the level of the process fluid when a level signal of the process fluid is within an end signal representing the end of the probe.

Abstract: A method includes obtaining first information defining one or more characteristics of (i) a tank configured to store material and/or (ii) one or more obstacles within the tank. The method also includes estimating one or more false echoes using the first information. The one or more false echoes represent one or more potential reflections of a signal off (i) one or more surfaces of the tank and/or (ii) one or more surfaces of the one or more obstacles. The method further includes providing second information identifying the one or more false echoes to a calculation algorithm configured to measure a characteristic of the material in the tank.

Abstract: An analytical model simulates the propagation of radiation through a coated continuous web where layer thickness and refractive index, as variables, determine the speed and direction of transmitted radiation. The model predicts characteristics of transmitted radiation based on characteristics of incident radiation and initially assigned values for layer thicknesses. Coating thickness(s) are ascertained in a process whereby incident radiation of known characteristics is directed onto a coated web and thereafter, actual measurements of transmitted radiation are compared to predicted characteristics. Using a fitting algorithm, the assigned thickness(es) of the layer(s) of the model are adjusted and the process repeated until the actual and predicted values are within desired limits at which time, the assigned thickness(es) represent the measured calipers.

Abstract: A method of configuring an electronic level gauge (ELG) includes with an ELG configuration tool including a GUI having a user interface. A processor implements an enhancement algorithm and a simulator. A tank library includes a plurality of tank shapes. The user interface receives application configuration information including a selection of a tank shape, a mounting location for positioning the ELG, and at least one process detail. The simulator generates a calculated strength of a measurement signal reflected from a surface of material in the tank for at least one level. If the calculated strength is ?a predetermined strength, proper performance of the ELG is indicated, and if the calculated strength <the predetermined strength, the ELG configuration tool prompts a change in at least one application of the configuration information to be entered on the user interface, and the simulator then recalculates the calculated strength.

Abstract: A diffuse reflector of radiation in the near and mid infrared regions includes (i) an assembly that has a reflecting element and a diffusing element that is made of one or more layers of calcium fluoride, sapphire, or alumina; or (ii) a diffusively reflective surface configured as a metallic layer with a rough surface. The diffuse reflector can be incorporated into systems for measuring properties of sheet materials and particularly into optical sensors that include a measurement window configured with one or more of the diffuse reflectors that cause incident radiation from a sensor light source to be diffused and reflected a plurality of times within a layer of material before being detected by the sensor receiver.

Abstract: An analytical model simulates the propagation of radiation through a coated continuous web where layer thickness and refractive index, as variables, determine the speed and direction of transmitted radiation. The model predicts characteristics of transmitted radiation based on characteristics of incident radiation and initially assigned values for layer thicknesses. Coating thickness(s) are ascertained in a process whereby incident radiation of known characteristics is directed onto a coated web and thereafter, actual measurements of transmitted radiation are compared to predicted characteristics. Using a fitting algorithm, the assigned thickness(es) of the layer(s) of the model are adjusted and the process repeated until the actual and predicted values are within desired limits at which time, the assigned thickness(es) represent the measured calipers.

Abstract: A system includes a signal source that provides a first signal for measuring a gas content of a liquid sample. The system also includes an analyzer that determines the gas content of the liquid sample using a measurement of a second signal, where the second signal is based on the first signal. The system further includes an apparatus with a walled structure having a cavity. The apparatus also includes a piston that pulls the liquid sample into the cavity and pushes the liquid sample out of the cavity. The apparatus further includes at least one measurement window having at least one inner surface exposed within the cavity. The at least one measurement window receives the first signal from the signal source and provides the second signal to the analyzer. The piston could also clean the at least one inner surface, and the piston can include a reference material for calibrating the analyzer.

Abstract: A diffuse reflector of radiation in the near and mid infrared regions includes (i) an assembly that has a reflecting element and a diffusing element that is made of one or more layers of calcium fluoride, sapphire, or alumina; or (ii) a diffusively reflective surface configured as a metallic layer with a rough surface. The diffuse reflector can be incorporated into systems for measuring properties of sheet materials and particularly into optical sensors that include a measurement window configured with one or more of the diffuse reflectors that cause incident radiation from a sensor light source to be diffused and reflected a plurality of times within a layer of material before being detected by the sensor receiver.

Abstract: A system includes a signal source that provides a first signal for measuring a gas content of a liquid sample. The system also includes an analyzer that determines the gas content of the liquid sample using a measurement of a second signal, where the second signal is based on the first signal. The system further includes an apparatus with a walled structure having a cavity. The apparatus also includes a piston that pulls the liquid sample into the cavity and pushes the liquid sample out of the cavity. The apparatus further includes at least one measurement window having at least one inner surface exposed within the cavity. The at least one measurement window receives the first signal from the signal source and provides the second signal to the analyzer. The piston could also clean the at least one inner surface, and the piston can include a reference material for calibrating the analyzer.