Patents by Inventor Adam Loyack

Adam Loyack has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8697217
    Abstract: The polishing pad is useful for polishing at least one of magnetic, optical and semiconductor substrates. The polishing pad includes a polishing layer having a polyurethane window. The polyurethane window has a cross-linked structure formed with an aliphatic or cycloaliphatic isocyanate and a polyol in a prepolymer mixture. The prepolymer mixture is reacted with a chain extender having OH or NH2 groups and having an OH or NH2 to unreacted NCO stoichiometry less than 95%. The polyurethane window has a time dependent strain less than or equal to 0.02% when measured with a constant axial tensile load of 1 kPa at a constant temperature of 60° C. at 140 minutes, a Shore D hardness of 45 to 90 and an optical double pass transmission of at least 15% at a wavelength of 400 nm for a sample thickness of 1.3 mm.
    Type: Grant
    Filed: January 15, 2010
    Date of Patent: April 15, 2014
    Assignee: Rohm and Haas Electronics Materials CMP Holdings, Inc.
    Inventors: Adam Loyack, Alan Nakatani, Mary Jo Kulp, David G. Kelly
  • Patent number: 8257545
    Abstract: A chemical mechanical polishing pad is provided, comprising: a polishing layer having a polishing surface; and, a light stable polymeric endpoint detection window, comprising: a polyurethane reaction product of an aromatic polyamine containing amine moieties and an isocyanate terminated prepolymer polyol containing unreacted —NCO moieties; and, a light stabilizer component comprising at least one of a UV absorber and a hindered amine light stabilizer; wherein the aromatic polyamine and the isocyanate terminated prepolymer polyol are provided at an amine moiety to unreacted —NCO moiety stoichiometric ratio of <95%; wherein the light stable polymeric endpoint detection window exhibits a time dependent strain of ?0.02% when measured with a constant axial tensile load of 1 kPa at a constant temperature of 60° C. at 100 minutes and an optical double pass transmission of ?15% at a wavelength of 380 nm for a window thickness of 1.
    Type: Grant
    Filed: September 29, 2010
    Date of Patent: September 4, 2012
    Assignee: Rohm and Haas Electronic Materials CMP Holdings, Inc.
    Inventors: Adam Loyack, Alan Nakatani, Mary Jo Kulp, David G. Kelly
  • Publication number: 20120077418
    Abstract: A chemical mechanical polishing pad is provided, comprising: a polishing layer having a polishing surface; and, a light stable polymeric endpoint detection window, comprising: a polyurethane reaction product of an aromatic polyamine containing amine moieties and an isocyanate terminated prepolymer polyol containing unreacted —NCO moieties; and, a light stabilizer component comprising at least one of a UV absorber and a hindered amine light stabilizer; wherein the aromatic polyamine and the isocyanate terminated prepolymer polyol are provided at an amine moiety to unreacted —NCO moiety stoichiometric ratio of <95%; wherein the light stable polymeric endpoint detection window exhibits a time dependent strain of ?0.02% when measured with a constant axial tensile load of 1 kPa at a constant temperature of 60° C. at 100 minutes and an optical double pass transmission of ?15% at a wavelength of 380 nm for a window thickness of 1.
    Type: Application
    Filed: September 29, 2010
    Publication date: March 29, 2012
    Applicant: Rohm and Haas Electronic Materials CMP Holdings, Inc.
    Inventors: Adam Loyack, Alan Nakatani, Mary Jo Kulp, David G. Kelly
  • Publication number: 20110177758
    Abstract: The polishing pad is useful for polishing at least one of magnetic, optical and semiconductor substrates. The polishing pad includes a polishing layer having a polyurethane window. The polyurethane window has a cross-linked structure formed with an aliphatic or cycloaliphatic isocyanate and a polyol in a prepolymer mixture. The prepolymer mixture is reacted with a chain extender having OH or NH2 groups and having an OH or NH2 to unreacted NCO stoichiometry less than 95%. The polyurethane window has a time dependent strain less than or equal to 0.02% when measured with a constant axial tensile load of 1 kPa at a constant temperature of 60° C. at 140 minutes, a Shore D hardness of 45 to 90 and an optical double pass transmission of at least 15% at a wavelength of 400 nm for a sample thickness of 1.3 mm.
    Type: Application
    Filed: January 15, 2010
    Publication date: July 21, 2011
    Inventors: Adam Loyack, Alan Nakatani, Mary Jo Kulp, David G. Kelly
  • Patent number: 7745567
    Abstract: A process for continuously stripping a polymer dispersion comprising a heat exchanger with minimal internal obstructions for the stripper. The process is particularly adapted to dispersions that are heat and shear sensitive. The process is able to extract hydrophobic VOC's more efficiently than a single, jacketed tube design.
    Type: Grant
    Filed: October 29, 2007
    Date of Patent: June 29, 2010
    Assignee: Rohm and Haas Company
    Inventors: James Kent Carpenter, Adam Loyack
  • Publication number: 20080103289
    Abstract: A process for continuously stripping a polymer dispersion comprising a heat exchanger with minimal internal obstructions for the stripper. The process is particularly adapted to dispersions that are heat and shear sensitive. The process is able to extract hydrophobic VOC's more efficiently than a single, jacketed tube design.
    Type: Application
    Filed: October 29, 2007
    Publication date: May 1, 2008
    Inventors: James Kent Carpenter, Adam Loyack