Patents by Inventor Adam Wax

Adam Wax has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6934035
    Abstract: The methods of the present invention are directed at an accurate phase-based technique for measuring arbitrarily long optical distances with sub-nanometer precision. A preferred embodiment of the present invention method employs a interferometer, for example, a Michelson interferometer, with a pair of harmonically related light sources, one continuous wave (CW) and a second source having low coherence. By slightly adjusting the center wavelength of the low coherence source between scans of the target sample, the phase relationship between the heterodyne signals of the CW and low coherence light is used to measure the separation between reflecting interfaces with sub-nanometer precision. As the preferred embodiment of this method is completely free of 2? ambiguity, an issue that plagues most phase-based techniques, it can be used to measure arbitrarily long optical distances without loss of precision.
    Type: Grant
    Filed: December 18, 2001
    Date of Patent: August 23, 2005
    Assignee: Massachusetts Institute of Technology
    Inventors: Changhuei Yang, Adam Wax, Ramachandra R. Dasari, Michael S. Feld
  • Publication number: 20050105097
    Abstract: Preferred embodiments of the present invention are directed to systems for phase measurement which address the problem of phase noise using combinations of a number of strategies including, but not limited to, common-path interferometry, phase referencing, active stabilization and differential measurement. Embodiment are directed to optical devices for imaging small biological objects with light. These embodiments can be applied to the fields of, for example, cellular physiology and neuroscience. These preferred embodiments are based on principles of phase measurements and imaging technologies. The scientific motivation for using phase measurements and imaging technologies is derived from, for example, cellular biology at the sub-micron level which can include, without limitation, imaging origins of dysplasia, cellular communication, neuronal transmission and implementation of the genetic code.
    Type: Application
    Filed: June 18, 2004
    Publication date: May 19, 2005
    Applicant: Massachusetts Institute of Technology
    Inventors: Christopher Fang-Yen, Gabriel Popescu, Changhuei Yang, Adam Wax, Ramachandra Dasari, Michael Feld
  • Publication number: 20050057756
    Abstract: Preferred embodiments of the present invention are directed to systems for phase measurement which address the problem of phase noise using combinations of a number of strategies including, but not limited to, common-path interferometry, phase referencing, active stabilization and differential measurement. Embodiment are directed to optical devices for imaging small biological objects with light. These embodiments can be applied to the fields of, for example, cellular physiology and neuroscience. These preferred embodiments are based on principles of phase measurements and imaging technologies. The scientific motivation for using phase measurements and imaging technologies is derived from, for example, cellular biology at the sub-micron level which can include, without limitation, imaging origins of dysplasia, cellular communication, neuronal transmission and implementation of the genetic code.
    Type: Application
    Filed: April 13, 2004
    Publication date: March 17, 2005
    Applicant: Massachusetts Institute of Technology
    Inventors: Christopher Fang-Yen, Gabriel Popescu, Changhuei Yang, Adam Wax, Ramachandra Dasari, Michael Feld
  • Publication number: 20040223162
    Abstract: An apparatus and method for obtaining depth-resolved spectra for the purpose of determining the size of scatterers by measuring their elastic scattering properties. Depth resolution is achieved by using a white light source in a Michelson interferometer and dispersing a mixed signal and reference fields. The measured spectrum is Fourier transformed to obtain an axial spatial cross-correlation between the signal and reference fields with near 1 &mgr;m depth-resolution. The spectral dependence of scattering by the sample is determined by windowing the spectrum to measure the scattering amplitude as a function of wavenumber.
    Type: Application
    Filed: May 6, 2003
    Publication date: November 11, 2004
    Applicant: Duke University
    Inventor: Adam Wax
  • Patent number: 6611339
    Abstract: Radiation that propagates undeflected through a turbid medium, undergoes a small change in phase velocity due to its wave nature. This change can be measured using a differential phase optical interferometer. Ballistic propagation can be classified into three regimes: For scatterers small compared to the wavelength, the turbid medium acts as a bulk medium; for large scatterers, phase velocity is independent of turbidity; and in the intermediate regime the phase velocity is strongly dependent on scatterer radius. In particular, for scatterers having intermediate size a phase velocity increase and negative dispersion is observed by adding positive dispersion scatterers of higher refractive index. These measurements are made using the phase difference between fundamental and harmonic light and can be used to provide diagnostic information and images of tissue or biological fluids.
    Type: Grant
    Filed: June 9, 2000
    Date of Patent: August 26, 2003
    Assignee: Massachusetts Institute of Technology
    Inventors: Changhuei Yang, Adam Wax, Michael S. Feld
  • Publication number: 20030112444
    Abstract: The methods of the present invention are directed at an accurate phase-based technique for measuring arbitrarily long optical distances with sub-nanometer precision. A preferred embodiment of the present invention method employs a interferometer, for example, a Michelson interferometer, with a pair of harmonically related light sources, one continuous wave (CW) and a second source having low coherence. By slightly adjusting the center wavelength of the low coherence source between scans of the target sample, the phase relationship between the heterodyne signals of the CW and low coherence light is used to measure the separation between reflecting interfaces with sub-nanometer precision. As the preferred embodiment of this method is completely free of 2&pgr; ambiguity, an issue that plagues most phase-based techniques, it can be used to measure arbitrarily long optical distances without loss of precision.
    Type: Application
    Filed: December 18, 2001
    Publication date: June 19, 2003
    Applicant: Massachusetts Institute of Technology
    Inventors: Changhuei Yang, Adam Wax, Ramachandra R. Dasari, Michael S. Feld