Patents by Inventor Adam ZREHEN

Adam ZREHEN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12168265
    Abstract: Systems comprising a light source, thin membrane immersed in an aqueous solution and a system to direct and focus light from the light source to a spot on the membrane are provided. Methods of thinning and etching a membrane are also provided, as are membranes comprising a nanopore with a Gaussian curve shaped cross-section.
    Type: Grant
    Filed: September 23, 2021
    Date of Patent: December 17, 2024
    Assignee: TECHNION RESEARCH & DEVELOPMENT FOUNDATION LIMITED
    Inventors: Amit Meller, Tal Gilboa, Adam Zrehen, Arik Girsault, Eran Zvuloni
  • Publication number: 20240362772
    Abstract: A method for defect probability estimation based on relationships with concepts, the method may include (a) obtaining an evaluated patch representation, and (b) determining that the evaluates patch representation is not faulty when at least one of the following occurs: (a) for each RPR of a first number (N1) of RPRs, a similarity between the evaluated patch representation is not lower than the first RPR similarity threshold of the RPR; or (b) for each RPR of a second number (N2) of RPRs, a similarity between the evaluated patch representation is lower than the first RPR similarity threshold and not lower than the second RPR similarity threshold of the RPR.
    Type: Application
    Filed: March 15, 2024
    Publication date: October 31, 2024
    Applicant: AI QUALISENSE 2021 LTD
    Inventor: Adam Zrehen
  • Publication number: 20240312179
    Abstract: A method for adaptive concept generation based on image context, the method include generating concepts that includes similarity thresholds for evaluating the similarity of received image sub-patches to reference image sub-patches of known properties.
    Type: Application
    Filed: March 18, 2024
    Publication date: September 19, 2024
    Applicant: AI QUALISENSE 2021 LTD
    Inventor: Adam Zrehen
  • Publication number: 20240311999
    Abstract: A method for detecting process variations in a manufacturing process, the method includes receiving an image of an evaluated manufactured item (EMI), the EMI was manufactured by the manufacturing process; generating EMI patches representations that are related to the EMI; wherein the EMI patches representations of the EMI are selected out of (a) representations of patches of the image of the EMI, or (b) patches of a representation of the image of the EMI; determining EMI patches representations scores, wherein an EMI patch representation score of a certain EMI patch representation is determined based on (a) one or more similarities between the certain EMI patch representation and one or more reference concepts of multiple reference concepts, and (b) one or more similarity thresholds of the one or more reference concepts; and determining a process variation score based on at least some of EMI patches representations scores.
    Type: Application
    Filed: March 15, 2024
    Publication date: September 19, 2024
    Applicant: AI QUALISENSE 2021 LTD
    Inventor: Adam Zrehen
  • Publication number: 20240312000
    Abstract: A method for context based detection of defects of manufactured items, the method may include (i) receiving an image of an evaluated manufactured item (EMI), the EMI was manufactured by a manufacturing process; (ii) generating EMI patches representations that are related to the EMI; wherein the EMI patches representations of the EMI are selected out of (a) representations of patches of the image of the EMI, or (b) patches of a representation of the image of the EMI; (iii) calculating EMI patches representations scores, wherein an EMI patch representation score of a certain EMI patch representation is determined based on similarities between the certain EMI patch representation and other EMI patch representations; and (iv) determining a defect related status of the EMI based on at least some of the EMI patches representations scores and on at least one similarity related values
    Type: Application
    Filed: March 15, 2024
    Publication date: September 19, 2024
    Applicant: AI QUALISENSE 2021 LTD
    Inventor: Adam Zrehen
  • Publication number: 20220009034
    Abstract: Systems comprising a light source, thin membrane immersed in an aqueous solution and a system to direct and focus light from the light source to a spot on the membrane are provided. Methods of thinning and etching a membrane are also provided, as are membranes comprising a nanopore with a Gaussian curve shaped cross-section.
    Type: Application
    Filed: September 23, 2021
    Publication date: January 13, 2022
    Inventors: Amit MELLER, Tal GILBOA, Adam ZREHEN, Arik GIRSAULT, Eran ZVULONI