Abstract: A bonding system for bonding a semiconductor element to a substrate is provided. The bonding system includes a bond head assembly for bonding a semiconductor element to a substrate at a bonding area of the bonding system; a reducing gas delivery system for providing a reducing gas to the bonding area during bonding of the semiconductor element to the substrate; and a gas composition analyzer configured for continuously monitoring a composition of the reducing gas during operation of the bonding system.

Abstract: A silicon interconnect fabric includes: (1) a substrate having a front side and a back side; (2) a front side patterned metal layer on the front side of the substrate; (3) a back side patterned metal layer on the back side of the substrate; (4) multiple conductive vias extending through the substrate and connecting the front side patterned metal layer and the back side patterned metal layer; and (5) multiple conductive posts connected to the back side patterned metal layer.

Abstract: A system is provided for interconnecting multiple functional dies on a single substrate, including: (1) multiple global links in the substrate; (2) multiple local links in the substrate; and (3) multiple utility dies on the substrate, wherein each of the utility dies is connected to at least one of the global links, the utility dies are configured to communicate with one another through the global links, each of the utility dies is connected to at least one of the local links and is configured to communicate with at least one of the functional dies through the at least one of the local links. In some embodiments, an antenna is integrated into the substrate.

Abstract: A silicon interconnect fabric includes: (1) a substrate having a front side and a back side; (2) a front side patterned metal layer on the front side of the substrate; (3) a back side patterned metal layer on the back side of the substrate; (4) multiple conductive vias extending through the substrate and connecting the front side patterned metal layer and the back side patterned metal layer; and (5) multiple conductive posts connected to the back side patterned metal layer.

Abstract: A fan-out wafer level package includes: (1) a flexible substrate; (2) a semiconductor component embedded in the flexible substrate, the semiconductor component including an active surface that is exposed from the flexible substrate, the semiconductor component including a bonding pad adjacent to the active surface; (3) a stress buffer layer disposed over the flexible substrate and the semiconductor component, the stress buffer layer defining an opening exposing the bonding pad of the semiconductor component; and (4) an interconnect disposed over the stress buffer layer and including a portion extending into the opening of the stress buffer layer to electrically connect to the bonding pad of the semiconductor component.

Abstract: A system is provided for interconnecting multiple functional dies on a single substrate, including: (1) multiple global links in the substrate; (2) multiple local links in the substrate; and (3) multiple utility dies on the substrate, wherein each of the utility dies is connected to at least one of the global links, the utility dies are configured to communicate with one another through the global links, each of the utility dies is connected to at least one of the local links and is configured to communicate with at least one of the functional dies through the at least one of the local links. In some embodiments, an antenna is integrated into the substrate.

Abstract: A fan-out wafer level package includes: (1) a flexible substrate; (2) a semiconductor component embedded in the flexible substrate, the semiconductor component including an active surface that is exposed from the flexible substrate, the semiconductor component including a bonding pad adjacent to the active surface; (3) a stress buffer layer disposed over the flexible substrate and the semiconductor component, the stress buffer layer defining an opening exposing the bonding pad of the semiconductor component; and (4) an interconnect disposed over the stress buffer layer and including a portion extending into the opening of the stress buffer layer to electrically connect to the bonding pad of the semiconductor component.