Patents by Inventor Adekunle Adeyemi
Adekunle Adeyemi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 12163815Abstract: A computer-implemented method of providing access to interferometric system data stored in a data repository. A query that includes a data parameter identifier is received. The data repository is accessed and the interferometric system data is stored in the data repository using a data structure that has one or more data parameter arrays and one or more corresponding data group members. Each data group member includes one or more data arrays each associated with a data parameter in the corresponding data parameter array. Using the data parameter identifier, one or more target data parameters are determined from among the one or more data parameter arrays. One or more target data arrays that correspond to the one or more target data parameters are determined from among the one or more data arrays. The interferometric system data, which is in the one or more target data arrays, is extracted.Type: GrantFiled: July 27, 2018Date of Patent: December 10, 2024Assignee: HIFI ENGINEERING INC.Inventors: Adekunle Adeyemi, Seyed Ehsan Jalilian
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Patent number: 11680829Abstract: There is provided a system for determining multiple baselines for detecting events in a conduit. The system comprises an optical fiber interrogator for interrogating optical fiber; and one or more processors communicative with the optical fiber interrogator and memory having stored thereon computer program code configured, when executed by the one or more processors, to cause the one or more processors to perform a method. The method comprises, for each of multiple channels of the conduit, each channel comprising a portion of the conduit: obtaining phase data for the channel, the phase data being obtained by causing the optical fiber interrogator to interrogate optical fiber positioned alongside the conduit; and determining one or more baselines from the phase data. As a result, events in the conduit may be detected with fewer false positives.Type: GrantFiled: July 20, 2022Date of Patent: June 20, 2023Assignee: HIFI ENGINEERING INC.Inventors: Adekunle Adeyemi, Seyed Ehsan Jalilian
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Publication number: 20220364888Abstract: There is provided a system for determining multiple baselines for detecting events in a conduit. The system comprises an optical fiber interrogator for interrogating optical fiber; and one or more processors communicative with the optical fiber interrogator and memory having stored thereon computer program code configured, when executed by the one or more processors, to cause the one or more processors to perform a method. The method comprises, for each of multiple channels of the conduit, each channel comprising a portion of the conduit: obtaining phase data for the channel, the phase data being obtained by causing the optical fiber interrogator to interrogate optical fiber positioned alongside the conduit; and determining one or more baselines from the phase data. As a result, events in the conduit may be detected with fewer false positives.Type: ApplicationFiled: July 20, 2022Publication date: November 17, 2022Inventors: Adekunle Adeyemi, Seyed Ehsan Jalilian
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Patent number: 11441926Abstract: There is provided a system for determining multiple baselines for detecting events in a conduit. The system comprises an optical fiber interrogator for interrogating optical fiber; and one or more processors communicative with the optical fiber interrogator and memory having stored thereon computer program code configured, when executed by the one or more processors, to cause the one or more processors to perform a method. The method comprises, for each of multiple channels of the conduit, each channel comprising a portion of the conduit: obtaining phase data for the channel, the phase data being obtained by causing the optical fiber interrogator to interrogate optical fiber positioned alongside the conduit; and determining one or more baselines from the phase data. As a result, events in the conduit may be detected with fewer false positives.Type: GrantFiled: January 8, 2019Date of Patent: September 13, 2022Assignee: HIFI ENGINEERING INC.Inventors: Adekunle Adeyemi, Seyed Ehsan Jalilian
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Patent number: 11085758Abstract: Methods, systems, and techniques for determining whether an event has occurred from dynamic strain measurements involve determining, using a processor, at least one event parameter from a signal representing the dynamic strain measurements, and then having the processor use the at least one event parameter to determine whether the event has occurred. The at least one event parameter is any one or more of a measure of magnitude of the signal, frequency centroid of the signal, filtered baseline of the signal, harmonic power of the signal, and time-integrated spectrum flux of the signal.Type: GrantFiled: February 28, 2020Date of Patent: August 10, 2021Assignee: Hifi Engineering, Inc.Inventors: Seyed Ehsan Jalilian, John Hull, Daniel Huang, Adekunle Adeyemi
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Publication number: 20210164812Abstract: There is provided a system for determining multiple baselines for detecting events in a conduit. The system comprises an optical fiber interrogator for interrogating optical fiber; and one or more processors communicative with the optical fiber interrogator and memory having stored thereon computer program code configured, when executed by the one or more processors, to cause the one or more processors to perform a method. The method comprises, for each of multiple channels of the conduit, each channel comprising a portion of the conduit: obtaining phase data for the channel, the phase data being obtained by causing the optical fiber interrogator to interrogate optical fiber positioned alongside the conduit; and determining one or more baselines from the phase data.Type: ApplicationFiled: January 8, 2019Publication date: June 3, 2021Inventors: Adekunle Adeyemi, Seyed Ehsan Jalilian
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Publication number: 20200200526Abstract: Methods, systems, and techniques for determining whether an event has occurred from dynamic strain measurements involve determining, using a processor, at least one event parameter from a signal representing the dynamic strain measurements, and then having the processor use the at least one event parameter to determine whether the event has occurred. The at least one event parameter is any one or more of a measure of magnitude of the signal, frequency centroid of the signal, filtered baseline of the signal, harmonic power of the signal, and time-integrated spectrum flux of the signal.Type: ApplicationFiled: February 28, 2020Publication date: June 25, 2020Applicant: Hifi Engineering Inc.Inventors: Seyed Ehsan Jalilian, John Hull, Daniel Huang, Adekunle Adeyemi
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Publication number: 20200200943Abstract: A computer-implemented method of providing access to interferometric system data stored in a data repository. A query that includes a data parameter identifier is received. The data repository is accessed and the interferometric system data is stored in the data repository using a data structure that has one or more data parameter arrays and one or more corresponding data group members. Each data group member includes one or more data arrays each associated with a data parameter in the corresponding data parameter array. Using the data parameter identifier, one or more target data parameters are determined from among the one or more data parameter arrays. One or more target data arrays that correspond to the one or more target data parameters are determined from among the one or more data arrays. The interferometric system data, which is in the one or more target data arrays, is extracted.Type: ApplicationFiled: July 27, 2018Publication date: June 25, 2020Inventors: Adekunle Adeyemi, Seyed Ehsan Jalilian
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Publication number: 20200092566Abstract: A method of determining a flow rate of a predetermined emissive substance involves: (a) generating a timed sequence of images; (b) partitioning a first image of the timed sequence into a plurality of blocks of pixels; (c) selecting from the plurality of blocks a selected block having calculated therefrom a first set of Discrete Cosine Transform (DCT) coefficients; (d) determining that the first set meets a condition associated with a predetermined threshold such that the first block represents an intensity pattern of the predetermined emissive substance at a first time; (e) selecting a corresponding block of a second image of the timed sequence, the corresponding block having DCT coefficients correlated to the first set such that the corresponding block represents the intensity pattern at a second time different from the first time; (f) determining a velocity associated with the selected block; and (g) determining the flow rate in response to the velocity.Type: ApplicationFiled: September 19, 2019Publication date: March 19, 2020Inventors: Adekunle Adeyemi, Thomas Darcie
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Patent number: 10584960Abstract: Methods, systems, and techniques for determining whether an event has occurred from dynamic strain measurements involve determining, using a processor, at least one event parameter from a signal representing the dynamic strain measurements, and then having the processor use the at least one event parameter to determine whether the event has occurred. The at least one event parameter is any one or more of a measure of magnitude of the signal, frequency centroid of the signal, filtered baseline of the signal, harmonic power of the signal, and time-integrated spectrum flux of the signal.Type: GrantFiled: March 1, 2016Date of Patent: March 10, 2020Assignee: Hifi Engineering Inc.Inventors: Seyed Ehsan Jalilian, John Hull, Daniel Huang, Adekunle Adeyemi
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Publication number: 20190072379Abstract: Methods, systems, and techniques for determining whether an event has occurred from dynamic strain measurements involve determining, using a processor, at least one event parameter from a signal representing the dynamic strain measurements, and then having the processor use the at least one event parameter to determine whether the event has occurred. The at least one event parameter is any one or more of a measure of magnitude of the signal, frequency centroid of the signal, filtered baseline of the signal, harmonic power of the signal, and time-integrated spectrum flux of the signal.Type: ApplicationFiled: March 1, 2016Publication date: March 7, 2019Applicant: Hifi Engineering Inc.Inventors: Seyed Ehsan Jalilian, John Hull, Daniel Huang, Adekunle Adeyemi