Patents by Inventor Adelbert Leber

Adelbert Leber has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11255653
    Abstract: A method for operating a surface measuring apparatus for measuring a surface of a workpiece. Method includes operating surface measuring apparatus having a probe that includes a probe arm that is deflectable by an angle about a swivel axis, and that on its end facing away from the swivel axis bears a probe element. Probe is movable relative to a base body of surface measuring apparatus along a linear axis. In method, a workpiece is contacted by moving the probe along the linear axis by use of the probe element, and after workpiece is contacted, probe arm is moved by a specified travel distance along the linear axis. The resulting angular deflection of the probe arm about the swivel axis is measured, and based on the specified travel distance and measured angular deflection of the probe arm, the probe arm is classified with regard to its length.
    Type: Grant
    Filed: December 18, 2019
    Date of Patent: February 22, 2022
    Assignee: JENOPTIK Industrial Metrology Germany GmbH
    Inventor: Adelbert Leber
  • Publication number: 20200200519
    Abstract: A method for operating a surface measuring apparatus for measuring a surface of a workpiece. Method includes operating surface measuring apparatus having a probe that includes a probe arm that is deflectable by an angle about a swivel axis, and that on its end facing away from the swivel axis bears a probe element. Probe is movable relative to a base body of surface measuring apparatus along a linear axis. In method, a workpiece is contacted by moving the probe along the linear axis by use of the probe element, and after workpiece is contacted, probe arm is moved by a specified travel distance along the linear axis. The resulting angular deflection of the probe arm about the swivel axis is measured, and based on the specified travel distance and measured angular deflection of the probe arm, the probe arm is classified with regard to its length.
    Type: Application
    Filed: December 18, 2019
    Publication date: June 25, 2020
    Inventor: Adelbert Leber