Patents by Inventor Adem G. Aydin
Adem G. Aydin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10379191Abstract: The disclosure relates to an apparatus and a method for vector scattering parameter (s-parameter) measurements, and more particularly, to an apparatus and a method for providing a simple, low cost solution for tests requiring vector s-parameter measurements. The apparatus includes a source which provides an input signal, a divider which splits the input signal to a reference signal and a testing signal, a phase shifter which shifts the reference signal by a first phase and outputs a phase shifted signal, a device under test (DUT) which shifts the testing signal by a second phase and outputs a DUT shifted signal, a combiner which combines the phase shifted signal and the DUT shifted signal into a combined signal, and a detector which detects a product of the phase shifted signal and the DUT shifted signal.Type: GrantFiled: January 11, 2018Date of Patent: August 13, 2019Assignee: GLOBALGOUNDRIES INC.Inventors: Adem G. Aydin, Hanyi Ding
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Publication number: 20180136304Abstract: The disclosure relates to an apparatus and a method for vector scattering parameter (s-parameter) measurements, and more particularly, to an apparatus and a method for providing a simple, low cost solution for tests requiring vector s-parameter measurements. The apparatus includes a source which provides an input signal, a divider which splits the input signal to a reference signal and a testing signal, a phase shifter which shifts the reference signal by a first phase and outputs a phase shifted signal, a device under test (DUT) which shifts the testing signal by a second phase and outputs a DUT shifted signal, a combiner which combines the phase shifted signal and the DUT shifted signal into a combined signal, and a detector which detects a product of the phase shifted signal and the DUT shifted signal.Type: ApplicationFiled: January 11, 2018Publication date: May 17, 2018Inventors: Adem G. AYDIN, Hanyi DING
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Patent number: 9910124Abstract: The disclosure relates to an apparatus and a method for vector scattering parameter (s-parameter) measurements, and more particularly, to an apparatus and a method for providing a simple, low cost solution for tests requiring vector s-parameter measurements. The apparatus includes a source which provides an input signal, a divider which splits the input signal to a reference signal and a testing signal, a phase shifter which shifts the reference signal by a first phase and outputs a phase shifted signal, a device under test (DUT) which shifts the testing signal by a second phase and outputs a DUT shifted signal, a combiner which combines the phase shifted signal and the DUT shifted signal into a combined signal, and a detector which detects a product of the phase shifted signal and the DUT shifted signal.Type: GrantFiled: February 4, 2016Date of Patent: March 6, 2018Assignee: GLOBALFOUNDRIES INC.Inventors: Adem G. Aydin, Hanyi Ding
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Publication number: 20170227622Abstract: The disclosure relates to an apparatus and a method for vector scattering parameter (s-parameter) measurements, and more particularly, to an apparatus and a method for providing a simple, low cost solution for tests requiring vector s-parameter measurements. The apparatus includes a source which provides an input signal, a divider which splits the input signal to a reference signal and a testing signal, a phase shifter which shifts the reference signal by a first phase and outputs a phase shifted signal, a device under test (DUT) which shifts the testing signal by a second phase and outputs a DUT shifted signal, a combiner which combines the phase shifted signal and the DUT shifted signal into a combined signal, and a detector which detects a product of the phase shifted signal and the DUT shifted signal.Type: ApplicationFiled: February 4, 2016Publication date: August 10, 2017Inventors: Adem G. AYDIN, Hanyi DING
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Patent number: 9214726Abstract: Aspects of the invention provide for an architecture and method for testing high frequency phase shifter arrays. In one embodiment, an architecture for testing a phase shifter array, includes: a plurality of power dividers, each power divider configured to receive an output from a phase shifter within the phase shifter array and split the output into a first signal and a second signal; a plurality of power clippers, each power clipper configured to receive the second signal and modify the second signal by limiting an amplitude of the second signal; a first power combiner configured to receive the first signal from each of the plurality of power dividers to generate a first output; and a second power combiner configured to receive the modified second signal from each of the plurality of power clippers to generate a second output.Type: GrantFiled: January 21, 2013Date of Patent: December 15, 2015Assignee: International Business Machines CorporationInventors: Adem G. Aydin, Hanyi Ding
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Patent number: 9008588Abstract: In a system and method computerized devices are connected to each other over a wireless network and to a controller over an additional network. The devices perform antenna beam angle testing of the wireless network. The controller receives, over the additional network, transmitted and received test signal data acquired during such testing. Based on the test signal data, the controller calculates calibration data, which indicates, for each pair of devices, different path loss amounts associated with different transmitted test signal beam angles and a single transmitted test signal power level. The controller generates calibration matrices corresponding to each pair of devices using the calibration data; analyzes the matrices to determine, for each pair, an optimal antenna beam angle that results in the least amount of path loss; determines an optimal power level for the pair based on the path loss; and communicates the optimal specifications to the pair.Type: GrantFiled: May 21, 2013Date of Patent: April 14, 2015Assignee: International Business Machines CorporationInventor: Adem G. Aydin
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Publication number: 20140349585Abstract: In a system and method computerized devices are connected to each other over a wireless network and to a controller over an additional network. The devices perform antenna beam angle testing of the wireless network. The controller receives, over the additional network, transmitted and received test signal data acquired during such testing. Based on the test signal data, the controller calculates calibration data, which indicates, for each pair of devices, different path loss amounts associated with different transmitted test signal beam angles and a single transmitted test signal power level. The controller generates calibration matrices corresponding to each pair of devices using the calibration data; analyzes the matrices to determine, for each pair, an optimal antenna beam angle that results in the least amount of path loss; determines an optimal power level for the pair based on the path loss; and communicates the optimal specifications to the pair.Type: ApplicationFiled: May 21, 2013Publication date: November 27, 2014Applicant: International Business Machines CorporationInventor: Adem G. Aydin
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Publication number: 20140203967Abstract: Aspects of the invention provide for an architecture and method for testing high frequency phase shifter arrays. In one embodiment, an architecture for testing a phase shifter array, includes: a plurality of power dividers, each power divider configured to receive an output from a phase shifter within the phase shifter array and split the output into a first signal and a second signal; a plurality of power clippers, each power clipper configured to receive the second signal and modify the second signal by limiting an amplitude of the second signal; a first power combiner configured to receive the first signal from each of the plurality of power dividers to generate a first output; and a second power combiner configured to receive the modified second signal from each of the plurality of power clippers to generate a second output.Type: ApplicationFiled: January 21, 2013Publication date: July 24, 2014Applicant: International Business Machines CorporationInventors: Adem G. Aydin, Hanyi Ding