Patents by Inventor Adi A. Scheidemann
Adi A. Scheidemann has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 9330892Abstract: An inorganic mass spectrometer capable of measuring a relevant and large or the full mass spectral range simultaneously may include a suitable ion source (e.g., an ICP mass spectrometer with an ICP ion source), an ion transfer region, ion optics to separate ions out of a plasma beam, a Mattauch-Herzog type mass spectrometer with a set of charged particle beam optics to condition the ion beam before an entrance slit, and a solid state multi-channel detector substantially separated from ground potential and separated from the potential of the magnet.Type: GrantFiled: July 3, 2014Date of Patent: May 3, 2016Assignee: SPECTRO ANALYTICAL INSTRUMENTS GMBHInventors: Dirk Ardelt, Ulrich Heynen, Adi A. Scheidemann
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Publication number: 20140312219Abstract: An inorganic mass spectrometer capable of measuring a relevant and large or the full mass spectral range simultaneously may include a suitable ion source (e.g., an ICP mass spectrometer with an ICP ion source), an ion transfer region, ion optics to separate ions out of a plasma beam, a Mattauch-Herzog type mass spectrometer with a set of charged particle beam optics to condition the ion beam before an entrance slit, and a solid state multi-channel detector substantially separated from ground potential and separated from the potential of the magnet.Type: ApplicationFiled: July 3, 2014Publication date: October 23, 2014Applicant: SPECTRO ANALYTICAL INSTRUMENTS GMBHInventors: Dirk ARDELT, Ulrich HEYNEN, Adi A. Scheidemann
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Publication number: 20110155903Abstract: An inorganic mass spectrometer capable of measuring a relevant and large or the full mass spectral range simultaneously may include a suitable ion source (e.g., an ICP mass spectrometer with an ICP ion source), an ion transfer region, an ion optics to separate ions out of a plasma beam, a Mattauch Herzog type mass spectrometer with a set of charged particle beam optics to condition the ion beam before the entrance slit, and a solid state multi channel detector substantially separated from ground potential and separated from the potential of the magnet is introduced.Type: ApplicationFiled: December 30, 2010Publication date: June 30, 2011Applicant: Spectro Analytical Instruments GmbHInventors: Dirk Ardelt, Ulrich Heynen, Adi A. Scheidemann
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Patent number: 7550722Abstract: A focal plane detector assembly of a mass spectrometer includes an ion detector configured to detect ions crossing a focal plane of the spectrometer and an electrically conductive mesh lying in a plane parallel to the focal plane, positioned such that ions exiting a magnet of the mass spectrometer pass through the mesh before contacting the ion detector. The mesh is maintained at a low voltage potential, relative to a circuit ground, which shields ions passing through the magnet from high voltage charges from other devices, such as microchannel plate electron multipliers. The mesh may be mounted directly to the magnet or positioned some distance away. The detector array may include any suitable device, including a faraday cup detector array, a strip charge detector array, or a CCD detector array.Type: GrantFiled: March 4, 2005Date of Patent: June 23, 2009Assignee: OI CorporationInventors: Adi A. Scheidemann, Gottfried P. Kibelka, Clare R. Long, Mark W. Dassel
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Patent number: 7511278Abstract: An apparatus for detecting particles, comprising a plurality of electrically conductive structures disposed on a support element. The structures are electrically insulated from one another and each structure can be electrically connected to an electronic read-out device. The structures receive a beam of particles in a direction forming an angle of incidence with the support element. A trough is disposed between each two successive structures as viewed in the beam direction. And at least partial overlap exists between each two successive structures. The apparatus can be disposed in the focal plane of a mass spectrometer.Type: GrantFiled: January 30, 2006Date of Patent: March 31, 2009Assignee: Spectro Analytical Instruments GmbH & Co. KGInventors: Adi A. Scheidemann, Dirk Ardelt, M. Bonner Denton
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Patent number: 7442920Abstract: Mass spectrometer systems for measuring mass/charge ratios of analytes are described. A mass spectrometer system includes a vacuum flange, a PCB base plate coupled to the vacuum flange, and an ion optic assembly coupled to the PCB base plate. The PCB base plate may include signal-processing electronics. The system may include an electrical cable coupled to the PCB base plate for supplying power, control, and I/O to the ion optic assembly and the signal processing electronics. Alternatively, a mass spectrometer system includes a PCB base plate and an ion optic assembly. The PCB base plate has a sealant portion and an electrical portion. The ion optic assembly is coupled to the electrical portion. The system may include a vacuum housing for enclosing the ion optic assembly. The vacuum housing is coupled to the sealant portion of the PCB base plate for sustaining a vacuum while the system is in operation.Type: GrantFiled: August 16, 2005Date of Patent: October 28, 2008Assignee: O. I. CorporationInventors: Adi A. Scheidemann, Mark S. McGraw, Clare R. Long, Gottfried P. Kibelka
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Patent number: 7372019Abstract: An ICP mass spectrometer comprising an ICP ion source, a mass analyzer having a magnetic sector field, a detector, an extraction element in the form of an ion funnel for transferring the generated ions into the mass analyzer and arranged between the ICP ion source and the mass analyzer, and a transport optics arranged between the ion funnel and the mass analyzer.Type: GrantFiled: May 18, 2006Date of Patent: May 13, 2008Assignee: Spectro Analytical Instruments GmbH & Co. KGInventors: Adi A. Scheidemann, Dirk Ardelt
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Patent number: 7282709Abstract: A charged particle beam detection system that includes a Faraday cup detector array (FCDA) for position-sensitive charged particle beam detection is described. The FCDA is combined with an electronic multiplexing unit (MUX) that allows collecting and integrating the charge deposited in the array, and simultaneously reading out the same. The duty cycle for collecting the ions is greater than 98%. This multiplexing is achieved by collecting the charge with a large number of small and electronically decoupled Faraday cups. Because Faraday cups collect the charge independent of their charge state, each cup is both a collector and an integrator. The ability of the Faraday cup to integrate the charge, in combination with the electronic multiplexing unit, which reads out and empties the cups quickly compared to the charge integration time, provides the almost perfect duty cycle for this position-sensitive charged particle detector. The device measures further absolute ion currents, has a wide dynamic range from 1.Type: GrantFiled: June 30, 2003Date of Patent: October 16, 2007Assignee: University of WashingtonInventors: Robert Bruce Darling, Adi A. Scheidemann, Frank J. Schumacher, IV, Patrick L. Jones
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Patent number: 6979818Abstract: A mass spectrometer suitable to measure both positive and negative particles, such as ions for example in a vacuum chamber. This spectrometer is provided with a turnable permanent magnet segment, which provides the gap of a yoke with adequate magnetic flux having the appropriate direction to separate the positive or the negative particles. Changing the polarity adjusts the flight path of the ions. Thus, negatively charged ions and positively charged ions will follow similar flight paths under opposite polarities, permitting the use of a single array of detectors. One or more coils may be used in place of or in addition to the turnable permanent magnet segment in order to provide the appropriate magnetic flux to the gap, and/or facilitate the turning process of the turnable magnet segment. The turnable magnet and/or the coils may be inside or outside the vacuum chamber.Type: GrantFiled: June 3, 2004Date of Patent: December 27, 2005Assignee: OI CorporationInventors: Adi A. Scheidemann, Mark W. Dassel, Mark Wadsworth, Eustathios Vassiliou
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Patent number: 6906333Abstract: A magnetic sector for charged particle beam transport that includes a magnetic field profile that achieves a linear dispersion from a collimated beam of charged particles proportional to their mass-energy-to-charge ratio. In one embodiment, the field profile necessary for the linear dispersion is obtained by the use of shaped, highly permeable poles powered by permanent magnets or electromagnetic coils.Type: GrantFiled: January 22, 2004Date of Patent: June 14, 2005Assignees: University of Washington, STI Optronics Inc.Inventors: Adi A. Scheidemann, Kem Robinson, Patrick L. Jones, Stephen C. Gottschalk
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Patent number: 6847036Abstract: A charged particle beam detection system (10) that includes a Faraday cup detector array (FCDA) for position-sensitive charged particle beam detection is described. The FCDA is combined with an electronic multiplexing unit (MUX) (2) that allows collecting and intgrating the charge deposited in the array, and simultaneously reading out the same. The duty cycle for collecting the ions is greater than 98%. This multiplexing (2) is achieved by collecting the charge with a large number of small and electronically decoupled Faraday cups. Because Faraday cups collect the charge independent of their charge state, each cup is both a collector and an integrator. The ability of the Faraday cup to integrate the charge, in combination with the electronic multiplexing unit (2), which reads out and empties the cups quickly compared to the charge integration time, provides the almost perfect duty cycle for this position-sensitive charged particle detector (10).Type: GrantFiled: October 6, 1999Date of Patent: January 25, 2005Assignee: University of WashingtonInventors: Robert Bruce Darling, Adi A. Scheidemann, Frank J. Schumacher IV, Patrick L. Jones
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Patent number: 6843375Abstract: A magnetic sector for charged particle beam transport that includes a magnetic field profile that achieves a linear dispersion from a collimated beam of charged particles proportional to their mass-energy-to-charge ratio. In one embodiment, the field profile necessary for the linear dispersion is obtained by the use of shaped, highly permeable poles powered by permanent magnets or electromagnetic coils.Type: GrantFiled: January 18, 2002Date of Patent: January 18, 2005Assignees: The University of Washington, STI Optronics, Inc.Inventors: Adi A. Scheidemann, Kem Robinson, Patrick L. Jones, Stephen C. Gottschalk
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Publication number: 20040222374Abstract: A spectrometer assembly comprising an ion detector array and a printed circuit board, wherein the ion detector array is attached on the printed circuit board, and the printed circuit board is secured on the same base plate that a magnetic section is secured. This configuration presents many advantages including, but not limited to, sturdy and convenient electrical connections between the assembly and following processing units, as well as mounting accuracy of the ion detector array in miscellaneous devices, and especially in front of magnetic sectors of spectrometers of the Mattauch and Herzog type. This invention pertains any types of ion detector arrays, with special emphasis to Strip Charge Detector Arrays, Faraday Cup Detector Arrays, and even more importantly to Shift Register Based Direct Ion Detection Chips.Type: ApplicationFiled: March 29, 2004Publication date: November 11, 2004Inventors: Adi A. Scheidemann, Mark McGraw, Eustathios Vassiliou
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Publication number: 20040149904Abstract: A magnetic sector for charged particle beam transport that includes a magnetic field profile that achieves a linear dispersion from a collimated beam of charged particles proportional to their mass-energy-to-charge ratio. In one embodiment, the field profile necessary for the linear dispersion is obtained by the use of shaped, highly permeable poles powered by permanent magnets or electromagnetic coils.Type: ApplicationFiled: January 22, 2004Publication date: August 5, 2004Applicants: The University of Washington, STI Optronics Inc.Inventors: Adi A. Scheidemann, Kem Robinson, Patrick L. Jones, Stephen C. Gottachalk
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Publication number: 20020162774Abstract: A magnetic sector for charged particle beam transport that includes a magnetic field profile that achieves a linear dispersion from a collimated beam of charged particles proportional to their mass-energy-to-charge ratio. In one embodiment, the field profile necessary for the linear dispersion is obtained by the use of shaped, highly permeable poles powered by permanent magnets or electromagnetic coils.Type: ApplicationFiled: January 18, 2002Publication date: November 7, 2002Applicant: The University of WashingtonInventors: Adi A. Scheidemann, Kem Robinson, Patrick L. Jones, Stephen C. Gottschalk
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Patent number: 6182831Abstract: A magnetic sector for charged particle beam transport that includes a magnetic field profile that achieves a linear dispersion from a collimated beam of charged particles proportional to their mass-energy-to-charge ratio. In one embodiment, the field profile necessary for the linear dispersion is obtained by the use of shaped, highly permeable poles powered by permanent magnets or electromagnetic coils.Type: GrantFiled: June 4, 1999Date of Patent: February 6, 2001Assignees: University of Washington, STI OptronicsInventors: Adi A. Scheidemann, Kem Robinson, Patrick L. Jones, Stephen C. Gottschalk