Patents by Inventor Adiel Reuvan Meyer Berman

Adiel Reuvan Meyer Berman has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • METHODS AND SYSTEMS FOR PATCH-BY-PATCH CHARACTERIZATION OF QUANTOM PROCESSORS
    Publication number: 20240046131
    Abstract: The present disclosure provides a method for characterizing a quantum processor including a plurality of qubits. The method comprising applying a characterization protocol to a qubit patch including a subset of qubits. The characterization protocol includes the reduction of ‘patching errors’—systematic characterization errors occurring due to interactions between qubits inside the patch and qubits outside the patch.
    Type: Application
    Filed: July 21, 2023
    Publication date: February 8, 2024
    Inventors: Dorit Aharonov, Ori Alberton, Eyal Bairey, Omri Golan, Or Golan, Avraham Eliyahu Haber, Yaron Itkin, Oded Kenneth, Yotam Yona Lifshitz, Netanel Hanan Lindner, Adiel Reuvan Meyer Berman, Omrie Ovdat, Assaf Zubida