Patents by Inventor Aditee Shrotre

Aditee Shrotre has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240071040
    Abstract: Methods and systems for implementing artificial intelligence enabled preparation end-pointing are disclosed. An example method at least includes obtaining an image of a surface of a sample, the sample including a plurality of features, analyzing the image to determine whether an end point has been reached, the end point based on a feature of interest out of the plurality of features observable in the image, and based on the end point not being reached, removing a layer of material from the surface of the sample.
    Type: Application
    Filed: November 7, 2023
    Publication date: February 29, 2024
    Inventors: Thomas Gary Miller, John F. Flanagan, IV, Brian Routh, JR., Richard Young, Brad Larson, Aditee Shrotre
  • Patent number: 11847813
    Abstract: Methods and systems for implementing artificial intelligence enabled preparation end-pointing are disclosed. An example method at least includes obtaining an image of a surface of a sample, the sample including a plurality of features, analyzing the image to determine whether an end point has been reached, the end point based on a feature of interest out of the plurality of features observable in the image, and based on the end point not being reached, removing a layer of material from the surface of the sample.
    Type: Grant
    Filed: October 12, 2021
    Date of Patent: December 19, 2023
    Assignee: FEI Company
    Inventors: Thomas Gary Miller, John F. Flanagan, IV, Brian Routh, Jr., Richard Young, Brad Larson, Aditee Shrotre
  • Patent number: 11355313
    Abstract: Apparatuses and methods directed toward endpoint detection are disclosed herein. An example method at least includes forming a plurality of lines on a top surface of a sample; removing, a plurality of times, material from a working surface of the sample, the working surface different than the top surface; imaging, a plurality of times, the sample to at least capture the plurality of lines; and determining an endpoint based on a relative spatial characteristic between two or more lines of the plurality of lines.
    Type: Grant
    Filed: June 30, 2020
    Date of Patent: June 7, 2022
    Assignee: FEI Company
    Inventors: Brian Routh, Jr., Brad Larson, Aditee Shrotre, Oleg Sidorov
  • Publication number: 20220067915
    Abstract: Methods and systems for implementing artificial intelligence enabled preparation end-pointing are disclosed. An example method at least includes obtaining an image of a surface of a sample, the sample including a plurality of features, analyzing the image to determine whether an end point has been reached, the end point based on a feature of interest out of the plurality of features observable in the image, and based on the end point not being reached, removing a layer of material from the surface of the sample.
    Type: Application
    Filed: October 12, 2021
    Publication date: March 3, 2022
    Applicant: FEI Company
    Inventors: Thomas Gary Miller, John F. Flanagan, IV, Brian Routh, JR., Richard Young, Brad Larson, Aditee Shrotre
  • Publication number: 20210407765
    Abstract: Apparatuses and methods directed toward endpoint detection are disclosed herein. An example method at least includes forming a plurality of lines on a top surface of a sample; removing, a plurality of times, material from a working surface of the sample, the working surface different than the top surface; imaging, a plurality of times, the sample to at least capture the plurality of lines; and determining an endpoint based on a relative spatial characteristic between two or more lines of the plurality of lines.
    Type: Application
    Filed: June 30, 2020
    Publication date: December 30, 2021
    Applicant: FEI Company
    Inventors: Brian Routh, JR., Brad Larson, Aditee Shrotre, Oleg Sidorov
  • Patent number: 11176656
    Abstract: Methods and systems for implementing artificial intelligence enabled preparation end-pointing are disclosed. An example method at least includes obtaining an image of a surface of a sample, the sample including a plurality of features, analyzing the image to determine whether an end point has been reached, the end point based on a feature of interest out of the plurality of features observable in the image, and based on the end point not being reached, removing a layer of material from the surface of the sample.
    Type: Grant
    Filed: May 10, 2019
    Date of Patent: November 16, 2021
    Assignee: FEI Company
    Inventors: Thomas Gary Miller, John F. Flanagan, IV, Brian Routh, Jr., Richard Young, Brad Larson, Aditee Shrotre
  • Publication number: 20200279362
    Abstract: Methods and systems for implementing artificial intelligence enabled preparation end-pointing are disclosed. An example method at least includes obtaining an image of a surface of a sample, the sample including a plurality of features, analyzing the image to determine whether an end point has been reached, the end point based on a feature of interest out of the plurality of features observable in the image, and based on the end point not being reached, removing a layer of material from the surface of the sample.
    Type: Application
    Filed: May 10, 2019
    Publication date: September 3, 2020
    Applicant: FEI Company
    Inventors: Thomas Gary Miller, John F. Flanagan, IV, Brian Routh, JR., Richard Young, Brad Larson, Aditee Shrotre