Patents by Inventor Adolf Fercher

Adolf Fercher has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20070291276
    Abstract: The invention is directed to a device for determining the thickness, distance and/or profile of areas of a transparent and/or diffuse object that are spaced apart, in particular for measuring distances in the eye. In the device for determining position using an interferometer arrangement based on the Michelson principle, a scanning unit is arranged for the change in path length in the reference beam or measurement beam path. The scanning unit comprises a scan table which is movable translationally in corresponding guides, the movement direction enclosing an angle ? to the reference beam. At least two reference mirrors having a distance d in direction of the reference beam and slightly overlapping laterally are arranged on the scan table so that during the oscillating movement of the scan table carried out by a motor the reference beam is reflected in itself first by the first reference mirror and then by the second reference mirror.
    Type: Application
    Filed: January 28, 2006
    Publication date: December 20, 2007
    Applicant: Carl Zeiss Meditec AG
    Inventor: Adolf Fercher
  • Publication number: 20060244972
    Abstract: Spatially localized dispersion measurement and glucose measurement by means of optical short-coherence interference refractometry. This application is directed to methods and arrangements for the measurement of the dispersion and of the glucose content in transparent and partially transparent tissues and body fluids. Methods of short-coherence interferometry and spectral interferometry are modified for the measurement of tissue thickness and for the measurement of local dispersion. In the technique based on short-coherence interferometry, partial interferograms from the short-coherence interferogram G(?) are used for the dispersion measurement. In the technique based on spectral interferometry, partial areas from the ?-spectrum of the spectral interferogram are used for the dispersion measurement. FIG. 6 shows an arrangement based on spectral interferometry. A temporally short-coherence light source illuminates the modified Michelson interferometer.
    Type: Application
    Filed: December 16, 2003
    Publication date: November 2, 2006
    Inventor: Adolf Fercher