Patents by Inventor Adolph C. Naujoks

Adolph C. Naujoks has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Piezoelectric switch
    Patent number: 6104119
    Abstract: A piezoelectric switch (10) is made by laminating one piezoelectric film (16) on the top and a second piezoelectric film (18) on the bottom sides of a stiff central core (14). The central core has one or more actuation areas or poppels (12) formed therein. Each piezoelectric film has an electrically conductive portion (15, 17) formed directly over the actuating area. When the actuating area on the laminate is depressed (11), the piezoelectric films each generate an electric signal that is sent through the electrically conductive portions, thus creating a switching signal.
    Type: Grant
    Filed: June 18, 1999
    Date of Patent: August 15, 2000
    Assignee: Motorola, Inc.
    Inventors: Andrzej T. Guzik, Rudy Yorio, William Boone Mullen, III, Adolph C. Naujoks
  • Switching method using a frequency domain piezoelectric switch
    Patent number: 6060817
    Abstract: A frequency domain switch (100) utilizes an array of cantilevered beams (108) laminated with a piezoelectric material (126). Each of the beams has a unique geometry, and produces a sinusoidal electrical signal in the piezoelectric film that is assignable only to one of the cantilevered beams. When a free end of one of the cantilevered beams is deflected, it produces a signal that is analyzed by suitable circuitry (410-440) to read the position of the switch.
    Type: Grant
    Filed: April 6, 1998
    Date of Patent: May 9, 2000
    Assignee: Motorola, Inc.
    Inventors: William Boone Mullen, III, Andrzej T. Guzik, Rudy Yorio, Adolph C. Naujoks
  • Method and apparatus for testing electronic circuitry in a manufacturing environment
    Patent number: 5714888
    Abstract: A manufacturing environment(100) includes test equipment (130) that tests circuitry (110) for functional operation. An electromagnetic probe (137) is operated adjacent to a substrate having electronic circuitry to be tested (310). The electromagnetic probe is activated to directly stimulate a localized portion of the electronic circuitry with a wireless signal (320). Functional operation of the circuitry is determined by measuring the response of the electronic circuitry (330, 340). In one embodiment, an array of electromagnetic probes is operated to receive near-field electromagnetic emissions emanating from the circuitry. These emissions are measured and an electromagnetic profile generated for a portion of the circuitry (330). The electromagnetic profile is analyzed to determine functional operation of the circuitry (340).
    Type: Grant
    Filed: December 26, 1995
    Date of Patent: February 3, 1998
    Assignee: Motorola, Inc.
    Inventor: Adolph C. Naujoks
  • Pivotable spring contact
    Patent number: 5159265
    Abstract: A pivotable spring probe (30) includes a housing (36) having an opening, a plunger (34) within and guided by the housing, the plunger being slidingly movable between an extended position and a retracted position, a pivotable contact head (32) mounted on the plunger for making electrical contact with a conductive surface external to the housing, and a spring (42) mounted on the bottom of the plunger for biasing the plunger towards the housing opening.
    Type: Grant
    Filed: September 19, 1991
    Date of Patent: October 27, 1992
    Assignee: Motorola, Inc.
    Inventors: Juan O. Alfonso, Peggy L. Clark, Adolph C. Naujoks, Ray D. Pearson