Patents by Inventor Adrian Berthold

Adrian Berthold has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8076228
    Abstract: A low noise transistor and a method of making a low noise transistor. A noise-reducing agent is introduced into the gate electrode and then moved into the gate dielectric of a transistor.
    Type: Grant
    Filed: January 29, 2007
    Date of Patent: December 13, 2011
    Assignee: Infineon Technologies AG
    Inventors: Adrian Berthold, Michael Bianco, Reinhard Mahnkopf
  • Publication number: 20080179695
    Abstract: A low noise transistor and a method of making a low noise transistor. A noise-reducing agent is introduced into the gate electrode and then moved into the gate dielectric of a transistor.
    Type: Application
    Filed: January 29, 2007
    Publication date: July 31, 2008
    Inventors: Adrian Berthold, Michael Bianco, Reinhard Mahnkopf
  • Patent number: 7018884
    Abstract: The present invention provides a method for parallel production of an MOS transistor in an MOS area of a substrate and a bipolar transistor in a bipolar area of the substrate. The method comprises generating an MOS preparation structure in the MOS area, wherein the MOS preparation structure comprises an area provided for a channel, a gate dielectric, a gate electrode layer and a mask layer on the gate electrode layer. Further, a bipolar preparation structure is generated in the bipolar area, which comprises a conductive layer and a mask layer on the conductive layer. The mask layer is thinned in the area of the gate electrode. For determining a gate electrode and a base terminal area, common structuring of the gate electrode layer and the conductive layer is performed.
    Type: Grant
    Filed: February 6, 2004
    Date of Patent: March 28, 2006
    Assignee: Infineon Technologies AG
    Inventors: Adrian Berthold, Josef Böck, Jürgen Holz, Wolfgang Klein
  • Patent number: 7005337
    Abstract: The present invention provides a method for parallel production of an MOS transistor in an MOS area of a substrate and a bipolar transistor in a bipolar area of the substrate. The method includes generating an MOS preparation structure in the MOS area, wherein the MOS preparation structure includes an area provided for a channel, a gate dielectric, a gate electrode layer and a mask layer on the gate electrode layer. Further, a bipolar preparation structure is generated in the bipolar area, which includes a conductive layer and a mask layer on the conductive layer. For determining a gate electrode and a base terminal area, common structuring of the gate electrode layer and the conductive layer is performed. Further, the method includes simultaneous generation of isolating spacing layers on side walls of the gate electrode layer in the MOS area and the conductive layer in the bipolar area by depositing a first and second spacing layer.
    Type: Grant
    Filed: February 6, 2004
    Date of Patent: February 28, 2006
    Assignee: Infineon Technologies AG
    Inventors: Adrian Berthold, Josef Boeck, Wolfgang Klein, Juergen Holz
  • Publication number: 20040185632
    Abstract: The present invention provides a method for parallel production of an MOS transistor in an MOS area of a substrate and a bipolar transistor in a bipolar area of the substrate. The method comprises generating an MOS preparation structure in the MOS area, wherein the MOS preparation structure comprises an area provided for a channel, a gate dielectric, a gate electrode layer and a mask layer on the gate electrode layer. Further, a bipolar preparation structure is generated in the bipolar area, which comprises a conductive layer and a mask layer on the conductive layer. For determining a gate electrode and a base terminal area, common structuring of the gate electrode layer and the conductive layer is performed. Further, the method comprises simultaneous generation of isolating spacing layers on side walls of the gate electrode layer in the MOS area and the conductive layer in the bipolar area by depositing a first and second spacing layer.
    Type: Application
    Filed: February 6, 2004
    Publication date: September 23, 2004
    Applicant: Infineon Technologies AG
    Inventors: Adrian Berthold, Josef Boeck, Wolfgang Klein, Juergen Holz
  • Publication number: 20040185611
    Abstract: The present invention provides a method for parallel production of an MOS transistor in an MOS area of a substrate and a bipolar transistor in a bipolar area of the substrate. The method comprises generating an MOS preparation structure in the MOS area, wherein the MOS preparation structure comprises an area provided for a channel, a gate dielectric, a gate electrode layer and a mask layer on the gate electrode layer. Further, a bipolar preparation structure is generated in the bipolar area, which comprises a conductive layer and a mask layer on the conductive layer. The mask layer is thinned in the area of the gate electrode. For determining a gate electrode and a base terminal area, common structuring of the gate electrode layer and the conductive layer is performed.
    Type: Application
    Filed: February 6, 2004
    Publication date: September 23, 2004
    Applicant: Infineon Technologies AG
    Inventors: Adrian Berthold, Josef Bock, Jurgen Holz, Wolfgang Klein
  • Patent number: 6020050
    Abstract: A semiconductor chip has a membrane mounted on supports that are held in the material of the chip so that the membrane is supported at a space from the chip. The membrane may be a metal layer. The supports are columns or webs that extend into the chip material. Electrical connections to the membrane may be made by conductive supports.
    Type: Grant
    Filed: October 10, 1997
    Date of Patent: February 1, 2000
    Assignee: Siemens Aktiengesellschaft
    Inventors: Ulrich Naher, Adrian Berthold, Thomas Scheiter, Christofer Hierold