Abstract: A test contactor is provided. The test socket includes a printed circuit board (PCB) that transfers electrical signals through a plurality of PCB traces. The plurality of PCB traces couples a signal source to a signal destination. The test contactor also has a first test contact that couples to a first signal pathway from the plurality of PCB traces, whereby the first test contact may be utilized for transferring the electrical signals. The test contactor also has a second test contact that is coupled to a second signal pathway from the plurality of PCB traces, whereby the second test contact may be utilized to provide a ground voltage. The first test contact and the second test contact are of different lengths. A method of testing an integrated circuit is also provided.

Abstract: A test structure operable to receive an integrated circuit is described. The test structure includes a substrate, a test contact member, a base structure, an aperture, and a conductive contact member. The test contact member extends from a surface of the substrate and has a tip at one end. The base structure is suspended above the surface of the substrate and has an aperture in which the test contact member is positioned. Furthermore, the conductive member is disposed in the aperture. The conductive member is positioned further away from the surface of the substrate compared to the tip of the test contact member. A method to test an integrated circuit (IC) utilizing the test contactor is also described.