Abstract: In certain aspects, a semiconductor die includes a first cell and a second cell. The first cell includes first transistors, and a first interconnect structure interconnecting the first transistors to form a first circuit. The second cell includes second transistors, and a second interconnect structure interconnecting the second transistors to form a second circuit. The first circuit and the second circuit are configured to perform a same function, and a length of the first cell in a first lateral direction is greater than a length of the second cell in the first lateral direction.

Abstract: In certain aspects, a semiconductor die includes a first cell and a second cell. The first cell includes first transistors, and a first interconnect structure interconnecting the first transistors to form a first circuit. The second cell includes second transistors, and a second interconnect structure interconnecting the second transistors to form a second circuit. The first circuit and the second circuit are configured to perform a same function, and a length of the first cell in a first lateral direction is greater than a length of the second cell in the first lateral direction.

Abstract: An integrated circuit compensates for circuit aging by measuring the aging with an aging sensor and controlling a supply voltage based on the measured aging. The operating environment for the aging sensor can be set to reduce impacts of non-aging effects on the measured aging. For example, the operating environment can use a temperature inversion voltage. An initial aging measurement value which is the difference between an initial aged measurement and an initial unaged measurement can be stored on the integrated circuit. A core power reduction controller can use the measured aging and the stored initial aging measurement value to update a performance-sensor target value and then perform adaptive voltage scaling using the using the updated performance-sensor target value.

Abstract: Disclosed herein are methods of preventing freezing of relays in electrical components operated in specific atmospheric conditions. One such method described herein comprises monitoring a temperature of a relay with a thermocouple located on a contact of the relay while monitoring ambient temperature within the relay. Operation of the electrical component is simulated in a sub-zero temperature and high humidity condition. A freeze potential of the relay is determined by plotting a temperature cross-over curve, wherein both the ambient temperature and the contact temperature are plotted during the operation and cool down period. If the high freeze potential is determined, one or both of the relay and the electrical component are modified with a modification configured to decrease the high freeze potential.

Abstract: Disclosed herein are methods of preventing freezing of relays in electrical components operated in specific atmospheric conditions. One such method described herein comprises monitoring a temperature of a relay with a thermocouple located on a contact of the relay while monitoring ambient temperature within the relay. Operation of the electrical component is simulated in a sub-zero temperature and high humidity condition. A freeze potential of the relay is determined by plotting a temperature cross-over curve, wherein both the ambient temperature and the contact temperature are plotted during the operation and cool down period. If the high freeze potential is determined, one or both of the relay and the electrical component are modified with a modification configured to decrease the high freeze potential.

Abstract: Disclosed herein are embodiments of testing apparatus used to prevent freezing of relays in electrical components, particularly electrical components used in vehicles. One embodiment of a testing apparatus comprises a chamber with temperature control configured to control a temperature of an internal atmosphere of the chamber and a humidifier in fluid communication with the internal atmosphere of the chamber configured to supply humidified air to the internal atmosphere. A sealable opening in a wall of the chamber is configured to pass a wire harness from external the chamber to inside the chamber while maintaining a sealed environment within the chamber. The temperature control is configured to maintain a sub-zero temperature in the internal atmosphere while the humidifier maintains a saturated internal atmosphere.

Abstract: An integrated circuit includes multiple power domains. Supply current switch circuits (SCSCs) are distributed across each power domain. When a signal is present on a control node within a SCSC, the SCSC couples a local supply bus of the power domain to a global supply bus. An enable signal path extends through the SCSCs so that an enable signal can be propagated down a chain of SCSCs from control node to control node, thereby turning the SCSCs on one by one. When the domain is to be powered up, a control circuit asserts an enable signal that propagates down a first chain of SCSCs. After a programmable amount of time, the control circuit asserts a second enable signal that propagates down a second chain. By spreading the turning on of SCSCs over time, large currents that would otherwise be associated with coupling the local and global buses together are avoided.

Abstract: An integrated circuit includes multiple power domains. Supply current switch circuits (SCSCs) are distributed across each power domain. When a signal is present on a control node within a SCSC, the SCSC couples a local supply bus of the power domain to a global supply bus. An enable signal path extends through the SCSCs so that an enable signal can be propagated down a chain of SCSCs from control node to control node, thereby turning the SCSCs on one by one. When the domain is to be powered up, a control circuit asserts an enable signal that propagates down a first chain of SCSCs. After a programmable amount of time, the control circuit asserts a second enable signal that propagates down a second chain. By spreading the turning on of SCSCs over time, large currents that would otherwise be associated with coupling the local and global buses together are avoided.