Abstract: Apparatus and methods for testing electronic devices. In some embodiments, a fixture for testing an electronic device can include a support frame including a base and a pair of side supports implemented on respective sides of the base, with at least one of the side supports including a plurality of features for mounting of a test hardware, and the base being configured to support a first test board. The fixture can further include an upper support positioned above the support frame and configured to support a second test board. The fixture can further include a suspension mechanism implemented to couple the upper support to the side supports such that the upper support is movable relative to the support frame to accommodate a misalignment between the upper support and the base.

Abstract: A printed circuit board (PCB) assembly having a double-ended male blade electrical terminal is presented. The double-ended terminal has a first blade with a substantially uniform first thickness and a second blade opposite the first blade that has an embossed mesial region providing a substantially uniform second thickness, wherein the effective thickness of the second blade is greater than the thickness of the first blade. The terminal may be used in an electrical center of a motor vehicle to interconnect a female socket in a vehicle wiring harness to an electronic device, such as a fuse or relay, having a socket terminal that is mounted on the PCB. A method of manufacturing such as double ended-terminal is also presented.

Abstract: A modular test fixture for testing electronic devices. In some embodiments, such a modular test fixture can include a support frame having a base, and a substrate having a plurality of test components, with the substrate being coupled to the base. The modular test fixture can further include an upper support positioned above the support frame, and a plurality of suspension elements that each extend between the upper support and the support frame. The suspension elements can couple the upper support to the support frame, and the upper support can be movable relative to the support frame. The modular test fixture can further include a daughterboard module coupled to the upper support, and a daughterboard having a test device interface. The daughterboard can be coupled to the daughterboard module and be operatively coupled to the plurality of test components.

Abstract: An electrical contact includes a pair of prongs that extend from a base of the electrical contact spaced apart by a gap disposed therebetween. The gap is configured to receive a mating electrical contact that mechanically and electrically communicates with the pair of prongs. A plane defined along respective exterior surfaces of the pair of prongs is such that a portion of one prong of the pair of prongs is bisected by the plane. A method of making an electrical contact includes a step of stamping out a piece from a sheet of electrically-conducting material and another step of folding one or more portions of the piece to at least produce the pair of prongs of the electrical contact spaced apart by the gap. An electrical assembly includes a printed circuit board and at least one electrical contact that contains the pair of prongs.