Patents by Inventor Adrian M. Schrell

Adrian M. Schrell has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240094063
    Abstract: A system and method for determining an object characteristic from a timed sequence of measured characteristics wherein the object characteristic is determined based on a comparison of a current measured characteristic against a variable reference characteristic. The variable reference characteristic is selected by iterating through the timed sequenced and determining a separate quality metric for the current measured characteristic against each earlier measured characteristic and selecting the variable reference as a function of the determined quality metrics. In one embodiment, iteration continues only until an earlier measured characteristics is found with a quality metric that meets or exceeds a threshold value. In another embodiment, iteration continues through a plurality of earlier measured characteristic (perhaps all) and the variable reference is selected as the earlier measured characteristic with the highest quality metric. The measured characteristics may include OFDR measurements.
    Type: Application
    Filed: November 10, 2023
    Publication date: March 21, 2024
    Inventors: Daniel C. Sweeney, Christian M. Petrie, Adrian M. Schrell
  • Publication number: 20210348971
    Abstract: A system and method for determining an object characteristic from a timed sequence of measured characteristics wherein the object characteristic is determined based on a comparison of a current measured characteristic against a variable reference characteristic. The variable reference characteristic is selected by iterating through the timed sequenced and determining a separate quality metric for the current measured characteristic against each earlier measured characteristic and selecting the variable reference as a function of the determined quality metrics. In one embodiment, iteration continues only until an earlier measured characteristics is found with a quality metric that meets or exceeds a threshold value. In another embodiment, iteration continues through a plurality of earlier measured characteristic (perhaps all) and the variable reference is selected as the earlier measured characteristic with the highest quality metric. The measured characteristics may include OFDR measurements.
    Type: Application
    Filed: May 3, 2021
    Publication date: November 11, 2021
    Inventors: Daniel C. Sweeney, Christian M. Petrie, Adrian M. Schrell