Patents by Inventor Adrian Pascal Nievergelt

Adrian Pascal Nievergelt has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and device of using a scanning probe microscope
    Patent number: 11112426
    Abstract: A scanning probe microscope for high-speed imaging and/or nanomechanical mapping including a scanning probe comprising a cantilever with a tip at the distal end, and means for modulating a tip-sample distance separating the tip from an intended sample to be viewed with the microscope, the means for modulating being adapted to provide a direct cantilever actuation.
    Type: Grant
    Filed: May 11, 2016
    Date of Patent: September 7, 2021
    Assignee: ECOLE POLYTECHNIQUE FEDERALE DE LAUSANNE (EPFL)
    Inventors: Georg Ernest Fantner, Jonathan David Adams, Adrian Pascal Nievergelt
  • Method and Device of Using a Scanning Probe Microscope
    Publication number: 20180106830
    Abstract: a scanning probe microscope for high-speed imaging and/or nanomechanical mapping. The microscope comprises a scanning probe comprising a cantilever with a tip at the distal end; and means for modulating a tip-sample distance separating the tip from an intended sample to be viewed with the microscope, the means for modulating being adapted to provide a direct cantilever actuation.
    Type: Application
    Filed: May 11, 2016
    Publication date: April 19, 2018
    Inventors: Georg Ernest Fantner, Jonathan David Adams, Adrian Pascal Nievergelt