Abstract: In an embodiment, an integrated circuit includes: a voltage regulator to receive a first voltage and regulate the first voltage to output a regulated voltage; a first logic circuit to operate using the regulated voltage; and a regulator control circuit to receive a control signal during a boot of the integrated circuit via a general purpose pad of the integrated circuit and control the voltage regulator to operate in one of an enabled mode and a bypass mode based at least in part on the control signal.

Abstract: In an embodiment, an integrated circuit includes: a voltage regulator to receive a first voltage and regulate the first voltage to output a regulated voltage; a first logic circuit to operate using the regulated voltage; and a regulator control circuit to receive a control signal during a boot of the integrated circuit via a general purpose pad of the integrated circuit and control the voltage regulator to operate in one of an enabled mode and a bypass mode based at least in part on the control signal.

Abstract: A data processing circuit contains a register file (17) with a write port and a pipeline of instruction processing stages (10a-d). A timing circuit (14) is arranged to time transfer of instruction dependent information between the stages at mutually different time points, so that processing of successive instructions in respective stages partially overlaps. A first and a second one of the stages (10c,d) are in series in the pipeline. Each of the first and a second one of the stages has a result output for writing a result to the write port, if instruction dependent information in the stage concerned (10c,d) requires writing. A write sequencing circuit (144) performs write tests alternately for instruction dependent information in the first and second one of the stages (10c,d). When the write sequencing circuit (144) performs the write test for a particular one of the stages (10c,d), it tests whether the instruction dependent information in the particular one of the stages (10c,d) requires writing of a result.

Abstract: There is provided an electronic circuit adapted to process a plurality of types of instruction, the electronic circuit comprising first and second pipeline stages and a latch positioned between the pipeline stages; wherein the electronic circuit is adapted to operate in a normal mode when processing a first type of instruction in which the latch is opened and closed in response to an enable signal, and a reduced mode when processing a second type of instruction in which the latch is held open so that the instruction propagates through the first and second pipeline stages without being stored in the latch; and wherein the first type of instruction requires processing by the first and second pipeline stages and the second type of instruction requires processing by the second pipeline stage.

Abstract: An electronic circuit is provided that comprises first and second combinational logic blocks and a latch positioned between the combinational logic blocks; wherein the electronic circuit is adapted to operate in a normal mode in which the latch is opened and closed in response to an enable signal, and a test mode in which the latch is held open.

Abstract: There is provided an electronic circuit that is harder to crack using power analysis techniques, the electronic circuit comprising first and second pipeline stages and a latch positioned between the pipeline stages; wherein the electronic circuit is adapted to operate in a normal mode in which the latch is opened and closed in response to an enable signal, and a reduced mode in which the latch is held open to reduce a current peak associated with the opening and closing of the latch.

Abstract: An integrated circuit is provided with at least one processing unit (TM), a cache memory (L2 BANK) having a plurality of memory modules, and remapping means (RM) for performing an unrestricted remapping within said plurality of memory modules. Accordingly, faulty modules can be remapped without limitations in order to optimise the utilization of the memory modules by providing an even distribution of the faulty modules.