Patents by Inventor Adrianus Franciscus Johannes Hammen

Adrianus Franciscus Johannes Hammen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Scanning electron microscope
    Patent number: 11024481
    Abstract: A scanning electron microscope. The scanning electron microscope may include a sliding vacuum seal between the electron optical imaging system and the sample carrier with a first plate having a first aperture associated with the electron optical imaging system and resting against a second plate having a second aperture associated with the sample carrier. The first plate and/or the second plate includes a groove circumscribing the first and/or second aperture. The scanning electron microscope may include a detector movable relative to the electron beam. The scanning electron microscope may include a motion control unit for moving a sample carrier along a collision free path.
    Type: Grant
    Filed: August 31, 2020
    Date of Patent: June 1, 2021
    Assignee: FEI Company
    Inventors: Karel Diederick Van Der Mast, Adrianus Franciscus Johannes Hammen, Wilhelmus Henrica Cornelis Theuws, Sander Richard Marie Stoks
  • SCANNING ELECTRON MICROSCOPE
    Publication number: 20200402760
    Abstract: A scanning electron microscope. The scanning electron microscope may include a sliding vacuum seal between the electron optical imaging system and the sample carrier with a first plate having a first aperture associated with the electron optical imaging system and resting against a second plate having a second aperture associated with the sample carrier. The first plate and/or the second plate includes a groove circumscribing the first and/or second aperture. The scanning electron microscope may include a detector movable relative to the electron beam. The scanning electron microscope may include a motion control unit for moving a sample carrier along a collision free path.
    Type: Application
    Filed: August 31, 2020
    Publication date: December 24, 2020
    Inventors: Karel Diederick VAN DER MAST, Adrianus Franciscus Johannes HAMMEN, Wilhelmus Henrica Cornelis THEUWS, Sander Richard Marie STOKS
  • Scanning electron microscope
    Patent number: 10796879
    Abstract: A scanning electron microscope (1) including a sliding vacuum seal (20) between an electron optical imaging system (2) and a sample carrier (10) with a first plate (22) having a first aperture (24) associated with the electron optical imaging system and resting against a second plate (26) having a second aperture (28) associated with the sample carrier. The first plate and/or the second plate includes a groove (40) circumscribing the first and/or second aperture. The scanning electron microscope may include a detector (8) movable relative to the electron beam. The scanning electron microscope may include a motion control unit for moving a sample carrier along a collision free path.
    Type: Grant
    Filed: March 3, 2017
    Date of Patent: October 6, 2020
    Assignee: Phenom-World Holding B.V.
    Inventors: Karel Diederick Van Der Mast, Adrianus Franciscus Johannes Hammen, Wilhelmus Henrica Cornelis Theuws, Sander Richard Marie Stoks
  • Sample stage
    Patent number: 10580613
    Abstract: Sample stage, e.g. for use in a scanning electron microscope. The sample stage includes a base, a sample carrier, and an actuator assembly arranged for moving the sample carrier in at least one direction substantially parallel to the base. The actuator assembly is arranged so as not to contribute to the mechanical stiffness of the sample stage from the sample carrier to the base.
    Type: Grant
    Filed: June 3, 2019
    Date of Patent: March 3, 2020
    Assignee: Phenom-World Holding B.V.
    Inventors: Gerhardus Bernardus Stamsnijder, Paul Cornelis Maria van den Bos, Ton Antonius Cornelis Henricus Kluijtmans, Sander Richard Marie Stoks, Adrianus Franciscus Johannes Hammen, Karel Diederick van der Mast
  • SAMPLE STAGE
    Publication number: 20190287756
    Abstract: Sample stage, e.g. for use in a scanning electron microscope. The sample stage includes a base, a sample carrier, and an actuator assembly arranged for moving the sample carrier in at least one direction substantially parallel to the base. The actuator assembly is arranged so as not to contribute to the mechanical stiffness of the sample stage from the sample carrier to the base.
    Type: Application
    Filed: June 3, 2019
    Publication date: September 19, 2019
    Applicant: Phenom-World Holding B.V.
    Inventors: Gerhardus Bernardus Stamsnijder, Paul Cornelis Maria van den Bos, Ton Antonius Cornelis Henricus Kluijtmans, Sander Richard Marie Stoks, Adrianus Franciscus Johannes Hammen, Karel Diederick van der Mast
  • SCANNING ELECTRON MICROSCOPE
    Publication number: 20190103245
    Abstract: A scanning electron microscope (1) including a sliding vacuum seal (20) between an electron optical imaging system (2) and a sample carrier (10) with a first plate (22) having a first aperture (24) associated with the electron optical imaging system and resting against a second plate (26) having a second aperture (28) associated with the sample carrier. The first plate and/or the second plate includes a groove (40) circumscribing the first and/or second aperture. The scanning electron microscope may include a detector (8) movable relative to the electron beam. The scanning electron microscope may include a motion control unit for moving a sample carrier along a collision free path.
    Type: Application
    Filed: March 3, 2017
    Publication date: April 4, 2019
    Inventors: Karel Diederick VAN DER MAST, Adrianus Franciscus Johannes HAMMEN, Wilhelmus Henrica Cornelis; THEUWS, Sander Richard Marie STOKS
  • Sample Stage
    Publication number: 20170316913
    Abstract: Sample stage, e.g. for use in a scanning electron microscope. The sample stage includes a base, a sample carrier, and an actuator assembly arranged for moving the sample carrier in at least one direction substantially parallel to the base. The actuator assembly is arranged so as not to contribute to the mechanical stiffness of the sample stage from the sample carrier to the base.
    Type: Application
    Filed: November 11, 2015
    Publication date: November 2, 2017
    Inventors: Gerhardus Bernardus Stamsnijder, Paul Cornelis Maria van den Bos, Ton Antonius Cornelis Henricus Kluijtmans, Sander Richard Marie Stoks, Adrianus Franciscus Johannes Hammen, Karel Diederick van der Mast