Patents by Inventor Aeksit Suraphak

Aeksit Suraphak has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System and method for erase test of integrated circuit device having non-homogeneously sized sectors
    Patent number: 6966016
    Abstract: A system and method for testing a flash memory device having uniform sectors and smaller, “boot” sectors includes determining uniform and boot test limits. The uniform and boot test limits are determined based on average erase and APDE time periods of the uniform and boot sectors, respectively. In this way, the erase test results for each sector type is compared against test limits that are based only on that sector type, thereby avoiding excessive false rejects.
    Type: Grant
    Filed: April 16, 2001
    Date of Patent: November 15, 2005
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Janevoot Naksrikram, Aeksit Suraphak, Jitrayut Junnapart
  • System and method for erase test of integrated circuit device having non-homogeneously sized sectors
    Publication number: 20020152435
    Abstract: A system and method for testing a flash memory device having uniform sectors and smaller, “boot” sectors includes determining uniform and boot test limits based on average erase and APDE time periods of the uniform and boot sectors, respectively. In this way, the erase test results for each sector type is compared against test limits that are based only on that sector type, thereby avoiding excessive false rejects.
    Type: Application
    Filed: April 16, 2001
    Publication date: October 17, 2002
    Inventors: Janevoot Naksrikram, Aeksit Suraphak, Jitrayut Junnapart