Patents by Inventor Afroz J. Zaman

Afroz J. Zaman has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Antenna Near-Field Probe Station Scanner
    Publication number: 20110032253
    Abstract: A miniaturized antenna system is characterized non-destructively through the use of a scanner that measures its near-field radiated power performance. When taking measurements, the scanner can be moved linearly along the x, y and z axis, as well as rotationally relative to the antenna. The data obtained from the characterization are processed to determine the far-field properties of the system and to optimize the system. Each antenna is excited using a probe station system while a scanning probe scans the space above the antenna to measure the near field signals. Upon completion of the scan, the near-field patterns are transformed into far-field patterns. Along with taking data, this system also allows for extensive graphing and analysis of both the near-field and far-field data. The details of the probe station as well as the procedures for setting up a test, conducting a test, and analyzing the resulting data are also described.
    Type: Application
    Filed: August 16, 2010
    Publication date: February 10, 2011
    Inventors: Afroz J. Zaman, Richard Q. Lee, William G. Darby, Philip J. Barr, Kevin M. Lambert, Felix A. Miranda
  • Antenna near-field probe station scanner
    Patent number: 7876276
    Abstract: A miniaturized antenna system is characterized non-destructively through the use of a scanner that measures its near-field radiated power performance. When taking measurements, the scanner can be moved linearly along the x, y and z axis, as well as rotationally relative to the antenna. The data obtained from the characterization are processed to determine the far-field properties of the system and to optimize the system. Each antenna is excited using a probe station system while a scanning probe scans the space above the antenna to measure the near field signals. Upon completion of the scan, the near-field patterns are transformed into far-field patterns. Along with taking data, this system also allows for extensive graphing and analysis of both the near-field and far-field data. The details of the probe station as well as the procedures for setting up a test, conducting a test, and analyzing the resulting data are also described.
    Type: Grant
    Filed: August 2, 2006
    Date of Patent: January 25, 2011
    Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space Administration
    Inventors: Afroz J. Zaman, Richard Q. Lee, William G. Darby, Philip J. Barr, Kevin M Lambert, Felix A. Miranda