Patents by Inventor Agnieszka PRIEBE

Agnieszka PRIEBE has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for characterizing a sample combining an X-ray characterization technique and a secondary ionization mass spectrometry characterization technique
    Patent number: 10481109
    Abstract: A method for characterizing a sample combining an X-ray tomography characterization technique and a secondary ionization mass spectrometry characterization technique, includes: a step of providing a tip that includes first and second end surfaces, a first cylindrical region bearing the first end surface and a second region in contact with the first cylindrical region and becoming slimmer towards the second end surface; a step of machining the second region to obtain a sample holder including a flat surface, the flat surface forming an end surface of the sample holder, the area of the flat surface being less than the area of the first end surface; a step of placing the sample on the flat surface of the sample holder; a first step of characterization of the sample using an X-ray characterization technique; a second step of characterization of the sample using a secondary ionization mass spectrometry characterization technique.
    Type: Grant
    Filed: February 1, 2017
    Date of Patent: November 19, 2019
    Assignee: COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES
    Inventors: Agnieszka Priebe, Guillaume Audoit, Jean-Paul Barnes
  • METHOD FOR CHARACTERIZING A SAMPLE COMBINING AN X-RAY CHARACTERIZATION TECHNIQUE AND A SECONDARY IONIZATION MASS SPECTROMETRY CHARACTERIZATION TECHNIQUE
    Publication number: 20170219502
    Abstract: A method for characterizing a sample combining an X-ray tomography characterization technique and a secondary ionization mass spectrometry characterization technique, includes: a step of providing a tip that includes first and second end surfaces, a first cylindrical region bearing the first end surface and a second region in contact with the first cylindrical region and becoming slimmer towards the second end surface; a step of machining the second region to obtain a sample holder including a flat surface, the flat surface forming an end surface of the sample holder, the area of the flat surface being less than the area of the first end surface; a step of placing the sample on the flat surface of the sample holder; a first step of characterization of the sample using an X-ray characterization technique; a second step of characterization of the sample using a secondary ionization mass spectrometry characterization technique.
    Type: Application
    Filed: February 1, 2017
    Publication date: August 3, 2017
    Inventors: Agnieszka PRIEBE, Guillaume AUDOIT, Jean-Paul BARNES