Abstract: Systems and methods for testing a peripheral in accordance with a high-speed serial interface protocol are provided. A test system can test a peripheral by providing user-specified control over a test processor (which is substantially the same processor the peripheral will interface with when installed) to test, calibrate, or both test and calibrate the peripheral. The test processor can communicate with the peripheral according to the high-speed serial interface protocol, thereby effectively providing an actual “in-device” environment for testing and/or calibrating the peripheral.

Abstract: Setting a slew rate, e.g., a rising time or a falling time, of a scanning signal can be performed with a first operation, and a shunting resistance of the scanning line can be set with a second operation. A scanning system that scans a display screen, a touch screen, etc., can set a desired slew rate during a first period of time and can set a desired shunting resistance during a second period of time. A gate line system can sequentially scan gate lines to display an image during a display phase of a touch screen. The gate line system can, for example, increase the falling times of gate line signals. After the falling gate line signal has stabilized, for example, the gate line system can decrease the shunting resistance of the gate line.

Abstract: Systems, methods, and devices relating to directly bonding electrode pads of a flexible printed circuit (FPC) to electrode pads of a glass substrate are provided. In one example, such a system may include a glass substrate with electrode pads and an FPC with corresponding electrode pads. A joining edge of each electrode pad of the FPC may couple directly to a joining edge of a corresponding electrode pad of the glass substrate, without an intervening conductive adhesive layer or an anisotropic conductive film (ACF) layer, or a combination thereof.

Abstract: Systems and methods for preventing parasitic capacitances within liquid crystal displays are provided. A display panel according to an embodiment may include, for example, a pixel with a pixel electrode and a transistor coupled to a gate line. Additionally, the pixel may include a shielding conductor interposed between the pixel electrode and the gate line. The shielding conductor may shield the pixel electrode from a parasitic capacitance with the gate line by causing a parasitic capacitance to form between the gate line and the shielding conductor instead of between the gate line and the pixel electrode.

Abstract: A method and system is disclosed for powering device sub-circuitry of an electronic device. The sub-circuitry may be used to provide control signals to a direct current switcher on a main system board, thus eliminating passive circuitry typically associated with the sub-circuitry. Furthermore, by actively generating the control signals for the direct current switcher, explicit timing control circuitry is not required to synchronize the transmitted power to the sub-circuitry.

Abstract: An electronic circuit component is provided with shielding for electromagnetic interference (“EMI”) by covering at least part of the component with a layer of electrical insulation that conforms to the shape of the surface to which the insulation is applied. At least part of the surface of the insulation is then covered by a layer of EMI shielding that conforms to the shape of the surface of the insulation to which the shielding is applied.

Abstract: An electronic circuit component is provided with shielding for electro-magnetic interference (“EMI”) by covering at least part of the component with a layer of electrical insulation that conforms to the shape of the surface to which the insulation is applied. At least part of the surface of the insulation is then covered by a layer of EMI shielding that conforms to the shape of the surface of the insulation to which the shielding is applied.

Abstract: Systems, methods, and devices are disclosed, including a device having a liquid-crystal display (LCD) panel that includes a transistor-degradation circuit. In some embodiments, the transistor-degradation circuit is configured to output a signal indicative of a change in a property of a transistor on the LCD panel over time.

Abstract: An electronic circuit component is provided with shielding for electro-magnetic interference (“EMI”) by covering at least part of the component with a layer of electrical insulation that conforms to the shape of the surface to which the insulation is applied. At least part of the surface of the insulation is then covered by a layer of EMI shielding that conforms to the shape of the surface of the insulation to which the shielding is applied.

Abstract: Systems and methods for testing a peripheral in accordance with a MIPI protocol are provided. A test system can test a peripheral by providing user-specified control over a test processor (which is substantially the same processor the peripheral will interface with when installed) to test, calibrate, or both test and calibrate the peripheral. The test processor can communicate with the peripheral according to the MIPI protocol, thereby effectively providing an actual “in-device” environment for testing and/or calibrating the peripheral.