Patents by Inventor Ahmed H. Zewail

Ahmed H. Zewail has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9464998
    Abstract: An electron microscope system includes a laser system operable to generate an optical pulse and a pump pulse and a microscope column. The microscope column includes a multiple cathode structure having a plurality of spatially separated cathode regions. Each of the cathode regions are operable to generate an electron pulse. The microscope column also includes an electron acceleration region adjacent the multiple cathode structure, a specimen region operable to support a specimen, and a detector.
    Type: Grant
    Filed: June 19, 2015
    Date of Patent: October 11, 2016
    Assignee: CALIFORNIA INSTITUTE OF TECHNOLOGY
    Inventors: Ahmed H. Zewail, John Spencer Baskin, Haihua Liu
  • Publication number: 20160005566
    Abstract: An electron microscope system includes a laser system operable to generate an optical pulse and a pump pulse and a microscope column. The microscope column includes a multiple cathode structure having a plurality of spatially separated cathode regions. Each of the cathode regions are operable to generate an electron pulse. The microscope column also includes an electron acceleration region adjacent the multiple cathode structure, a specimen region operable to support a specimen, and a detector.
    Type: Application
    Filed: June 19, 2015
    Publication date: January 7, 2016
    Inventors: Ahmed H. Zewail, John Spencer Baskin, Haihua Liu
  • Patent number: 9053903
    Abstract: The present invention relates to methods and systems for 4D ultrafast electron microscopy (UEM)—in situ imaging with ultrafast time resolution in TEM. Single electron imaging is used as a component of the 4D UEM technique to provide high spatial and temporal resolution unavailable using conventional techniques. Other embodiments of the present invention relate to methods and systems for convergent beam UEM, focusing the electron beams onto the specimen to measure structural characteristics in three dimensions as a function of time. Additionally, embodiments provide not only 4D imaging of specimens, but characterization of electron energy, performing time resolved electron energy loss spectroscopy (EELS).
    Type: Grant
    Filed: December 9, 2013
    Date of Patent: June 9, 2015
    Assignee: California Institute of Technology
    Inventor: Ahmed H. Zewail
  • Patent number: 8963085
    Abstract: A method of obtaining PINEM images includes providing femtosecond optical pulse, generating electron pulses, and directing the electron pulses towards a sample. The method also includes overlapping the femtosecond optical pulses and the electron pulses spatially and temporally at the sample and transferring energy from the femtosecond optical pulses to the electron pulses. The method further includes detecting electron pulses having an energy greater than a zero loss value, providing imaging in space and time.
    Type: Grant
    Filed: September 24, 2013
    Date of Patent: February 24, 2015
    Assignee: California Institute of Technology
    Inventors: Ahmed H. Zewail, David J. Flannigan, Brett Barwick
  • Patent number: 8841613
    Abstract: A 4D electron tomography system includes a stage having one or more degrees of freedom, an electron source, and electron optics operable to direct electron pulses to impinge on a sample supported on the stage. A pulse of the electron pulses impinges on the sample at a first time. The system also includes a laser system and optics operable to direct optical pulses to impinge on the sample. A pulse of the optical pulses impinges on the sample at a second time. The system further includes a detector operable to receive the electron pulses passing through the sample, a controller operable to independently modify an orientation of the stage and at least one of the first time or the second time, a memory operable to store sets of images, and a processor operable to form a 4D tomographic image set from the sets of images.
    Type: Grant
    Filed: September 16, 2010
    Date of Patent: September 23, 2014
    Assignee: California Institute of Technology
    Inventors: Ahmed H. Zewail, Oh-Hoon Kwon, Omar Farghaly Mohammed Abdelsaboor, Ding-Shyue Yang
  • Patent number: 8766181
    Abstract: An optical system includes a beam splitter disposed along an optical axis and a set of mirrors optically coupled to the beam splitter. The set of mirrors are oriented perpendicular to each other. The optical system also includes a turning mirror optically coupled to a second mirror of the set of mirrors and a detector optically coupled to the turning mirror.
    Type: Grant
    Filed: May 13, 2013
    Date of Patent: July 1, 2014
    Assignee: California Institute of Technology
    Inventors: Ahmed H. Zewail, John Spencer Baskin
  • Publication number: 20140158883
    Abstract: The present invention relates to methods and systems for 4D ultrafast electron microscopy (UEM)—in situ imaging with ultrafast time resolution in TEM. Single electron imaging is used as a component of the 4D UEM technique to provide high spatial and temporal resolution unavailable using conventional techniques. Other embodiments of the present invention relate to methods and systems for convergent beam UEM, focusing the electron beams onto the specimen to measure structural characteristics in three dimensions as a function of time. Additionally, embodiments provide not only 4D imaging of specimens, but characterization of electron energy, performing time resolved electron energy loss spectroscopy (EELS).
    Type: Application
    Filed: December 9, 2013
    Publication date: June 12, 2014
    Applicant: California Institute of Technology
    Inventor: Ahmed H. Zewail
  • Publication number: 20140131574
    Abstract: An optical system includes a beam splitter disposed along an optical axis and a set of mirrors optically coupled to the beam splitter. The set of mirrors are oriented perpendicular to each other. The optical system also includes a turning mirror optically coupled to a second mirror of the set of mirrors and a detector optically coupled to the turning mirror.
    Type: Application
    Filed: May 13, 2013
    Publication date: May 15, 2014
    Applicant: CALIFORNIA INSTITUTE OF TECHNOLOGY
    Inventors: Ahmed H. Zewail, John Spencer Baskin
  • Patent number: 8686359
    Abstract: The present invention relates to methods and systems for 4D ultrafast electron microscopy (UEM)—in situ imaging with ultrafast time resolution in TEM. Single electron imaging is used as a component of the 4D UEM technique to provide high spatial and temporal resolution unavailable using conventional techniques. Other embodiments of the present invention relate to methods and systems for convergent beam UEM, focusing the electron beams onto the specimen to measure structural characteristics in three dimensions as a function of time. Additionally, embodiments provide not only 4D imaging of specimens, but characterization of electron energy, performing time resolved electron energy loss spectroscopy (EELS).
    Type: Grant
    Filed: April 16, 2013
    Date of Patent: April 1, 2014
    Assignee: California Institute of Technology
    Inventor: Ahmed H. Zewail
  • Publication number: 20140084160
    Abstract: A method of obtaining PINEM images includes providing femtosecond optical pulse, generating electron pulses, and directing the electron pulses towards a sample. The method also includes overlapping the femtosecond optical pulses and the electron pulses spatially and temporally at the sample and transferring energy from the femtosecond optical pulses to the electron pulses. The method further includes detecting electron pulses having an energy greater than a zero loss value, providing imaging in space and time.
    Type: Application
    Filed: September 24, 2013
    Publication date: March 27, 2014
    Applicant: California Institute of Technology
    Inventors: Ahmed H. Zewail, David J. Flannigan, Brett Barwick
  • Patent number: 8569695
    Abstract: A method of obtaining PINEM images includes providing femtosecond optical pulse, generating electron pulses, and directing the electron pulses towards a sample. The method also includes overlapping the femtosecond optical pulses and the electron pulses spatially and temporally at the sample and transferring energy from the femtosecond optical pulses to the electron pulses. The method further includes detecting electron pulses having an energy greater than a zero loss value, providing imaging in space and time.
    Type: Grant
    Filed: April 16, 2013
    Date of Patent: October 29, 2013
    Assignee: California Institute of Technology
    Inventors: Ahmed H. Zewail, David J. Flannigan, Brett Barwick
  • Publication number: 20130234023
    Abstract: The present invention relates to methods and systems for 4D ultrafast electron microscopy (UEM)—in situ imaging with ultrafast time resolution in TEM. Single electron imaging is used as a component of the 4D UEM technique to provide high spatial and temporal resolution unavailable using conventional techniques. Other embodiments of the present invention relate to methods and systems for convergent beam UEM, focusing the electron beams onto the specimen to measure structural characteristics in three dimensions as a function of time. Additionally, embodiments provide not only 4D imaging of specimens, but characterization of electron energy, performing time resolved electron energy loss spectroscopy (EELS).
    Type: Application
    Filed: April 16, 2013
    Publication date: September 12, 2013
    Applicant: California Institute of Technology
    Inventor: Ahmed H. Zewail
  • Publication number: 20130234022
    Abstract: A method of obtaining PINEM images includes providing femtosecond optical pulse, generating electron pulses, and directing the electron pulses towards a sample. The method also includes overlapping the femtosecond optical pulses and the electron pulses spatially and temporally at the sample and transferring energy from the femtosecond optical pulses to the electron pulses. The method further includes detecting electron pulses having an energy greater than a zero loss value, providing imaging in space and time.
    Type: Application
    Filed: April 16, 2013
    Publication date: September 12, 2013
    Applicant: California Institute of Technology
    Inventors: Ahmed H. Zewail, David J. Flannigan, Brett Barwick
  • Patent number: 8440970
    Abstract: The present invention relates to methods and systems for 4D ultrafast electron microscopy (UEM)—in situ imaging with ultrafast time resolution in TEM. Single electron imaging is used as a component of the 4D UEM technique to provide high spatial and temporal resolution unavailable using conventional techniques. Other embodiments of the present invention relate to methods and systems for convergent beam UEM, focusing the electron beams onto the specimen to measure structural characteristics in three dimensions as a function of time. Additionally, embodiments provide not only 4D imaging of specimens, but characterization of electron energy, performing time resolved electron energy loss spectroscopy (EELS).
    Type: Grant
    Filed: August 2, 2012
    Date of Patent: May 14, 2013
    Assignee: California Institute of Technology
    Inventor: Ahmed H. Zewail
  • Patent number: 8429761
    Abstract: A method of obtaining PINEM images includes providing femtosecond optical pulse, generating electron pulses, and directing the electron pulses towards a sample. The method also includes overlapping the femtosecond optical pulses and the electron pulses spatially and temporally at the sample and transferring energy from the femtosecond optical pulses to the electron pulses. The method further includes detecting electron pulses having an energy greater than a zero loss value, providing imaging in space and time.
    Type: Grant
    Filed: September 16, 2010
    Date of Patent: April 23, 2013
    Assignee: California Institute of Technology
    Inventors: Ahmed H. Zewail, David J. Flannigan, Brett Barwick
  • Publication number: 20120312986
    Abstract: The present invention relates to methods and systems for 4D ultrafast electron microscopy (UEM)—in situ imaging with ultrafast time resolution in TEM. Single electron imaging is used as a component of the 4D UEM technique to provide high spatial and temporal resolution unavailable using conventional techniques. Other embodiments of the present invention relate to methods and systems for convergent beam UEM, focusing the electron beams onto the specimen to measure structural characteristics in three dimensions as a function of time. Additionally, embodiments provide not only 4D imaging of specimens, but characterization of electron energy, performing time resolved electron energy loss spectroscopy (EELS).
    Type: Application
    Filed: August 2, 2012
    Publication date: December 13, 2012
    Applicant: California Institute of Technology
    Inventor: Ahmed H. Zewail
  • Patent number: 8247769
    Abstract: The present invention relates to methods and systems for 4D ultrafast electron microscopy (UEM)—in situ imaging with ultrafast time resolution in TEM. Single electron imaging is used as a component of the 4D UEM technique to provide high spatial and temporal resolution unavailable using conventional techniques. Other embodiments of the present invention relate to methods and systems for convergent beam UEM, focusing the electron beams onto the specimen to measure structural characteristics in three dimensions as a function of time. Additionally, embodiments provide not only 4D imaging of specimens, but characterization of electron energy, performing time resolved electron energy loss spectroscopy (EELS).
    Type: Grant
    Filed: October 7, 2009
    Date of Patent: August 21, 2012
    Assignee: California Institute of Technology
    Inventor: Ahmed H. Zewail
  • Patent number: 8203120
    Abstract: The present invention relates to methods and systems for 4D ultrafast electron microscopy (UEM)—in situ imaging with ultrafast time resolution in TEM. Single electron imaging is used as a component of the 4D UEM technique to provide high spatial and temporal resolution unavailable using conventional techniques. Other embodiments of the present invention relate to methods and systems for convergent beam UEM, focusing the electron beams onto the specimen to measure structural characteristics in three dimensions as a function of time. Additionally, embodiments provide not only 4D imaging of specimens, but characterization of electron energy, performing time resolved electron energy loss spectroscopy (EELS).
    Type: Grant
    Filed: October 7, 2009
    Date of Patent: June 19, 2012
    Assignee: California Institute of Technology
    Inventor: Ahmed H. Zewail
  • Publication number: 20110284744
    Abstract: A 4D electron tomography system includes a stage having one or more degrees of freedom, an electron source, and electron optics operable to direct electron pulses to impinge on a sample supported on the stage. A pulse of the electron pulses impinges on the sample at a first time. The system also includes a laser system and optics operable to direct optical pulses to impinge on the sample. A pulse of the optical pulses impinges on the sample at a second time. The system further includes a detector operable to receive the electron pulses passing through the sample, a controller operable to independently modify an orientation of the stage and at least one of the first time or the second time, a memory operable to store sets of images, and a processor operable to form a 4D tomgraphic image set from the sets of images.
    Type: Application
    Filed: September 16, 2010
    Publication date: November 24, 2011
    Applicant: California Institute of Technology
    Inventors: Ahmed H. Zewail, Oh-Hoon Kwon, Omar Farghaly Mohammed Abdelsaboor, Ding-Shyue Yang
  • Publication number: 20110220792
    Abstract: A method of obtaining PINEM images includes providing femtosecond optical pulse, generating electron pulses, and directing the electron pulses towards a sample. The method also includes overlapping the femtosecond optical pulses and the electron pulses spatially and temporally at the sample and transferring energy from the femtosecond optical pulses to the electron pulses. The method further includes detecting electron pulses having an energy greater than a zero loss value, providing imaging in space and time.
    Type: Application
    Filed: September 16, 2010
    Publication date: September 15, 2011
    Applicant: California Institute of Technology
    Inventors: Ahmed H. Zewail, David J. Flannigan, Brett Barwick