Patents by Inventor Ahmed S. Tantawy

Ahmed S. Tantawy has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Solution for full speed, parallel DUT testing
    Patent number: 9429623
    Abstract: A system for use in automated test equipment. In one embodiment, the system includes a configurable integrated circuit (IC) programmed to provide test patterns and an interface to at least one device under test (DUT). The system also includes a connection to the at least one DUT, wherein the connection is coupled directly between the configurable IC and the at least one DUT.
    Type: Grant
    Filed: May 27, 2011
    Date of Patent: August 30, 2016
    Assignee: ADVANTEST CORPORATION
    Inventors: W Scott Villareal Filler, Ahmed S. Tantawy, Erik H. Volkerink
  • SOLUTION FOR FULL SPEED, PARALLEL DUT TESTING
    Publication number: 20130138383
    Abstract: A system for use in automated test equipment. In one embodiment, the system includes a configurable integrated circuit (IC) programmed to provide test patterns and an interface to at least one device under test (DUT). The system also includes a connection to the at least one DUT, wherein the connection is coupled directly between the configurable IC and the at least one DUT.
    Type: Application
    Filed: May 27, 2011
    Publication date: May 30, 2013
    Applicant: ADVANTEST (SINGAPORE) PTE LTD
    Inventors: W Scott Villareal Filler, Ahmed S. Tantawy, Erik H. Volkerink