Patents by Inventor Ai-Chuan Chang

Ai-Chuan Chang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Probing device
    Patent number: 7782070
    Abstract: A probing device includes a rack that has an outer support member supporting a circuit layer and a center support member supporting a probe assembly. When the tester touching down the circuit layer of the probing device from the top side, the outer support member of the rack bears this touchdown stress. When the probes of the probe holder touching down the electronic components of an IC wafer under test, the center support member of the rack bears the reaction force from the IC wafer.
    Type: Grant
    Filed: June 4, 2008
    Date of Patent: August 24, 2010
    Assignee: MJC Probe Incorporated
    Inventors: Wei-Cheng Ku, Chih-Hao Ho, Ho-Hui Lin, Te-Chen Feng, Jun-Liang Lai, Jia-Chi Ho, Chih-Chung Chien, Chien-Huei Huang, Ai-Chuan Chang, Horng-Chuan Sun
  • PROBING DEVICE
    Publication number: 20090009198
    Abstract: A probing device includes a rack that has an outer support member supporting a circuit layer and a center support member supporting a probe assembly. When the tester touching down the circuit layer of the probing device from the top side, the outer support member of the rack bears this touchdown stress. When the probes of the probe holder touching down the electronic components of an IC wafer under test, the center support member of the rack bears the reaction force from the IC wafer.
    Type: Application
    Filed: June 4, 2008
    Publication date: January 8, 2009
    Applicant: MJC PROBE INCORPORATION
    Inventors: Wei-Cheng Ku, Chih-Hao Ho, Ho-Hui Lin, Te-Chen Feng, Jun-Liang Lai, Jia-Chi Ho, Chih-Chung Chien, Chien-Huei Huang, Ai-Chuan Chang, Horng-Chuan Sun