Abstract: A main control circuit generates a plurality of main control signals of different phases to local control circuits. The local control circuits produce row-related control signals greater in number than the main control signals in accordance with these main control signals. A semiconductor memory device can be easily adapted to change in bank structure, and can perform a fast and stable operation with a low current consumption.

Abstract: A main control circuit generates a plurality of main control signals of different phases to local control circuits. The local control circuits produce row-related control signals greater in number than the main control signals in accordance with these main control signals. A semiconductor memory device can be easily adapted to change in bank structure, and can perform a fast and stable operation with a low current consumption.

Abstract: A main control circuit generates a plurality of main control signals of different phases to local control circuits. The local control circuits produce row-related control signals greater in number than the main control signals in accordance with these main control signals.

Abstract: Outside core circuit, link circuits are concentratedly arranged in an LT link portion. The LT link information sent from the LT link portion is serially transferred to transfer control circuit. Transfer control portion converts the serially transferred link information to parallel information, and transfers the parallel information to latch circuits arranged in the core circuit and corresponding to circuits requiring the LT link information. An influence on an interconnection layout by laser trimmable link elements is eliminated.

Abstract: A main control circuit generates a plurality of main control signals of different phases to local control circuits. The local control circuits produce row-related control signals greater in number than the main control signals in accordance with these main control signals.

Abstract: Outside core circuit, link circuits are concentratedly arranged in an LT link portion. The LT link information sent from the LT link portion is serially transferred to transfer control circuit. Transfer control portion converts the serially transferred link information to parallel information, and transfers the parallel information to latch circuits arranged in the core circuit and corresponding to circuits requiring the LT link information. An influence on an interconnection layout by laser trimmable link elements is eliminated.

Abstract: A main control circuit generates a plurality of main control signals of different phases to local control circuits. The local control circuits produce row-related control signals larger in number than the main control signals in accordance with these main control signals. A semiconductor memory device can be easily adapted to change in bank structure, and can perform a fast and stable operation with a low current consumption.

Abstract: An input buffer of a semiconductor device is provided. A first voltage shift circuit converts an input signal formed of a low amplitude logic signal overlapping 1.65V or 2.9V to a first signal formed of a complimentary signal formed of the low amplitude logic signal overlapping 2.9V or 1.65V. A second voltage shift circuit converts a reference potential of 1.65V or 2.9V to a second signal of 2.9V or 1.65V. A differential amplifier compares the reference potential with the input signal when the reference potential is 1.65V, and compares the first signal and the second signal when the reference potential is 2.9V. The input buffer thus operates normally whichever of 1.65V and 2.9V is the reference potential.

Abstract: An output circuit and a synchronous semiconductor memory device according to the invention suppress output of invalid data, and perform data output with exact timings. The synchronous semiconductor memory device includes a plurality of output buffers provided correspondingly to data I/O terminals, a plurality of data transfer latch circuits and a plurality of output control signal latch circuits. Data transfer latch circuit transfers data read from a memory cell to the corresponding output buffer in response to an internal clock signal. The output control signal latch circuit issues an output control signal to the corresponding output buffer in synchronization with the internal clock signal. Thereby, an output timing of each output buffer can be controlled independently of the other output buffer.