Abstract: A testing device for testing an optical sample that comprises a radiation source for emitting a plurality of optical beams along an optical axis. In addition, the testing device comprises an optical element designed as a filter element for imprinting a specific polarization-direction onto the plurality of optical beams or filtering light reflected or transmitted by the optical sample. The testing device also comprises a rotation unit designed for rotating the optical sample lying on the optical axis by a rotation angle relatively to the filter element. The testing device also comprises a detection unit for determining a polarization axis of the optical sample from the rotation angle and a reflected light beam, from the plurality of optical beams, reflected by the optical sample or transmitted through the optical sample, as well as a measure for the decentration value of the optical sample.

Abstract: A device for imaging through an optical system to be tested. The device comprises a first device section with a first degree of transmission for electromagnetic waves and a second device section with a second degree of transmission for the electromagnetic waves, wherein the second degree of transmission is greater than the first degree of transmission. At least one of the device sections has an annular shape.

Abstract: An apparatus for measuring the MTF or another optical property of an optical system includes an object to be imaged, which has a plurality of structures arranged in a plane and separated from one another, a two-dimensional image sensor, and collecting optics having a focal length f. The image sensor has a distance a from the collecting optics with 0.94·f?a?1.1·f. A holder for the optical system is arranged such that the optical system is located in a beam path between the object and the collecting optics. The image sensor and the collecting optics are configured such that all structures can be imaged by the optical system and the collecting optics onto the image sensor simultaneously.

Abstract: A measuring apparatus for measuring a modulation transfer function (MTF) of an afocal optical system has a receiving device, a light-providing device, a camera, at least one further light-providing device, at least one further camera, and a transmission interface. In an operational state, the light-providing device, the afocal optical system, and the camera are arranged coaxially on or with measurement axes parallel to a measuring axis oriented perpendicularly to the receiving plane. The further light-providing device, the afocal optical system, and the further camera are arranged coaxially on or with measurement axes parallel to an oblique measuring axis oriented obliquely to the measuring axis. An evaluation unit is configured to identify, using at least one camera image, the modulation transfer function of the afocal optical system.

Abstract: The invention relates to an apparatus (2) for detecting imaging quality of an optical system (4) with at least one lens (6) or lens group. The apparatus (2) includes an MTF measuring apparatus (10) for measuring a modulation transfer function at a plurality of field points in the field of view of the optical system (4), and a centering measuring apparatus (18) for measuring a centered state of the optical system (4).

Abstract: The invention relates to an apparatus (2) for detecting imaging quality of an optical system (4) with at least one lens (6) or lens group. The apparatus (2) includes an MTF measuring apparatus (10) for measuring a modulation transfer function at a plurality of field points in the field of view of the optical system (4), and a centering measuring apparatus (18) for measuring a centered state of the optical system (4).

Abstract: The invention relates to an apparatus (2) for detecting imaging quality of an optical system (4) with at least one lens (6) or lens group. The apparatus (2) includes an MTF measuring apparatus (10) for measuring a modulation transfer function at a plurality of field points in the field of view of the optical system (4), and a centering measuring apparatus (18) for measuring a centered state of the optical system (4). Furthermore, the invention relates to a method for detecting imaging quality of an optical system (4) having such a apparatus (2).

Abstract: An apparatus (10) and method for adjusting and/or calibrating a multi-camera module (2) having a plurality of cameras (4a, 4b). The apparatus (10) includes an optical arrangement for creating first virtual test structures (22) at an infinite distance and second test structures (26, 32) at a finite distance. Individual images (20a, 20b) captured with the cameras (4a, 4b) of the multi-camera module (2) include respectively the first and the second test structure (22, 26, 32). Based on the deviation of the position of the test structures (22, 26, 32) in the two individual images (20a, 20b), the cameras (4a, 4b) of the multi-camera module (2) are aligned relative to each other.

Abstract: The invention relates to an apparatus (2) for detecting imaging quality of an optical system (4) with at least one lens (6) or lens group. The apparatus (2) includes an MTF measuring apparatus (10) for measuring a modulation transfer function at a plurality of field points in the field of view of the optical system (4), and a centering measuring apparatus (18) for measuring a centered state of the optical system (4). Furthermore, the invention relates to a method for detecting imaging quality of an optical system (4) having such a apparatus (2).

Abstract: An apparatus for measuring a wavelength-dependent optical characteristic of an optical system has a light-pattern generation device which generates a pattern of polychromatic light in an object plane. Together with the optical system, a measuring optical unit images the object plane on a spatially resolving light sensor. A dispersive optical element is arranged in a light path between the optical system and the light sensor in such a way that a plurality of images of the pattern with different wavelengths are generated simultaneously on the light sensor. The evaluation device determines the wavelength-dependent characteristic of the optical system from the plurality of images on the light sensor.

Abstract: In a method for measuring the positions of centers of curvature of optical surfaces of a single- or multi-lens optical system, an imaging lens system images an object plane into a first and a second image plane. The first image plane is produced by a first ancillary lens system having a first focal length and defining a first beam path, while the second image plane is produced by a second ancillary lens system having a second focal length that is different from the first focal length and defining a second beam path that is different from the first beam path. An object arranged in the object plane is then imaged simultaneously or sequentially at the first and the second image plane by means of measuring light. Reflections of the measuring light at optical surfaces of the optical system are detected by means of a spatially resolving light sensor. The actual positions of the first and the second center of curvature are calculated from the detected reflexes.

Abstract: In a method for measuring the positions of centres of curvature of optical surfaces of a single- or multi-lens optical system, an imaging lens system images an object plane into a first and a second image plane. The first image plane is produced by a first ancillary lens system having a first focal length and defining a first beam path, while the second image plane is produced by a second ancillary lens system having a second focal length that is different from the first focal length and defining a second beam path that is different from the first beam path. An object arranged in the object plane is then imaged simultaneously or sequentially at the first and the second image plane by means of measuring light. Reflections of the measuring light at optical surfaces of the optical system are detected by means of a spatially resolving light sensor. The actual positions of the first and the second centre of curvature are calculated from the detected reflexes.

Abstract: A method for measuring the positions of centers of curvature of optical surfaces of a single- or multi-lens optical system, an imaging lens system simultaneously images an object plane into a first and a second image plane. The optical system is arranged so that a supposed position of a first center of curvature is situated in the first image plane of the imaging lens system and a supposed position of a second center of curvature is situated in the second image plane of the imaging lens system. An object arranged in the object plane is then imaged simultaneously or sequentially at the first and the second image plane by means of measuring light. Reflections of the measuring light at optical surfaces of the optical system are detected by means of a spatially resolving light sensor. The actual positions of the first and the second center of curvature are calculated from the detected reflexes.

Abstract: An apparatus (10) and method for adjusting and/or calibrating a multi-camera module (2) having a plurality of cameras (4a, 4b). The apparatus (10) includes an optical arrangement for creating first virtual test structures (22) at an infinite distance and second test structures (26, 32) at a finite distance. Individual images (20a, 20b) captured with the cameras (4a, 4b) of the multi-camera module (2) include respectively the first and the second test structure (22, 26, 32). Based on the deviation of the position of the test structures (22, 26, 32) in the two individual images (20a, 20b), the cameras (4a, 4b) of the multi-camera module (2) are aligned relative to each other.

Abstract: An apparatus for measuring a wavelength-dependent optical characteristic of an optical system has a light-pattern generation device which generates a pattern of polychromatic light in an object plane. Together with the optical system, a measuring optical unit images the object plane on a spatially resolving light sensor. A dispersive optical element is arranged in a light path between the optical system and the light sensor in such a way that a plurality of images of the pattern with different wavelengths are generated simultaneously on the light sensor. The evaluation device determines the wavelength-dependent characteristic of the optical system from the plurality of images on the light sensor.

Abstract: A method for measuring the positions of centres of curvature of optical surfaces of a single- or multi-lens optical system, an imaging lens system simultaneously images an object plane into a first and a second image plane. The optical system is arranged so that a supposed position of a first centre of curvature is situated in the first image plane of the imaging lens system and a supposed position of a second centre of curvature is situated in the second image plane of the imaging lens system. An object arranged in the object plane is then imaged simultaneously or sequentially at the first and the second image plane by means of measuring light. Reflections of the measuring light at optical surfaces of the optical system are detected by means of a spatially resolving light sensor. The actual positions of the first and the second centre of curvature are calculated from the detected reflexes.

Abstract: A method measures the positions of centers of curvature of optical surfaces of a multi-lens optical system. The spacings between the surfaces are measured along a reference axis using an interferometer. Subsequently the centers of curvature of the surfaces are measured using an optical angle-measuring device. In the course of the measurement of the position of the center of curvature of a surface situated within the optical system, the measured positions of the centers of curvature of the surfaces situated between this surface and the angle-measuring device and the previously measured spacings between the surfaces are taken into consideration computationally. In this way, a particularly high accuracy of measurement is achieved, because desired spacings do not have to be fallen back upon.

Abstract: A method for measuring spacings between optical surfaces of a multi-lens optical system includes detecting the centring state of the optical system by taking into consideration all optical surfaces of the optical system. Then the optical system is adjusted in such a way, taking the centring state into consideration, that the optical axis of the optical system is aligned as far as possible with a reference axis. In a next step the spacings between the optical surfaces are determined with the aid of a short-coherence interferometer. The measuring-light ray directed onto the optical system for this purpose runs likewise along the reference axis.

Abstract: A method for measuring spacings between optical surfaces of a multi-lens optical system includes detecting the centring state of the optical system by taking into consideration all optical surfaces of the optical system. Then the optical system is adjusted in such a way, taking the centring state into consideration, that the optical axis of the optical system is aligned as far as possible with a reference axis. In a next step the spacings between the optical surfaces are determined with the aid of a short-coherence interferometer. The measuring-light ray directed onto the optical system for this purpose runs likewise along the reference axis.

Abstract: A method measures the positions of centres of curvature of optical surfaces of a multi-lens optical system. The spacings between the surfaces are measured along a reference axis using an interferometer. Subsequently the centres of curvature of the surfaces are measured using an optical angle-measuring device. In the course of the measurement of the position of the centre of curvature of a surface situated within the optical system, the measured positions of the centres of curvature of the surfaces situated between this surface and the angle-measuring device and the previously measured spacings between the surfaces are taken into consideration computationally. In this way, a particularly high accuracy of measurement is achieved, because desired spacings do not have to be fallen back upon.