Patents by Inventor Ajaiey Kumar Sharma

Ajaiey Kumar Sharma has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230398694
    Abstract: A test and measurement instrument includes one or more ports to connect to one or more devices under test (DUT) having tuning screws, and to a robot, one or more processors to configured to: send commands to the robot to position the tuning screws on the one or more DUTs to one or more sets of positions, each set of positions being a parameter set for the tuning screws, acquire a set of operating parameters for each parameter set from the one or more DUTs, generate a parameter set image for each set, create a combined image of the parameter set images, provide the combined image to a machine learning system to obtain a predicted set of values, adjust the predicted set of values to produce a set of predicted positions, send commands to the robot to position the tuning screws to positions in the set of predicted positions, obtain a set of tuned operating parameters from the one or more DUTs, and validate operation of the one or more DUTs.
    Type: Application
    Filed: May 19, 2023
    Publication date: December 14, 2023
    Applicant: Tektronix, Inc.
    Inventors: John J. Pickerd, Ajaiey Kumar Sharma, Kan Tan
  • Publication number: 20220390513
    Abstract: An input selector for electrically connecting one of a plurality of test signals from a device under test to a test and measurement instrument includes a multiplexer having multiple inputs, each of the multiple inputs coupled to a different one of the plurality of test signals from the device under test, and having an output of a selected one of the multiple inputs, and an amplifier coupled to the output of the multiplexer for amplifying the selected test signal of the device under test before being sent as an output of the input selector to the test and measurement instrument. In alternative architectures, two or more amplifiers are coupled to the plurality of test signals, and the multiplexer selects an output of one of the two amplifiers to pass to a measurement instrument for testing.
    Type: Application
    Filed: June 3, 2022
    Publication date: December 8, 2022
    Inventors: Shane A. Hazzard, Ajaiey Kumar Sharma, Timothy E. Bieber, John Marrinan, Andrew McCann, Pieter Christiaan Seidel, Josiah A. Bartlett