Patents by Inventor Ajay M. Koshti

Ajay M. Koshti has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11946883
    Abstract: A method includes determining a predicted contrast-to-noise ratio sensitivity function (CNR SF) for crack detection of a predetermined target flaw size with the radiographic inspection system in the selected set-up. The method also includes qualifying an inspection image quality indicator (IQI) for the predetermined target flaw size for use in the radiographic inspection system in the selected set-up. The method also includes performing an inspection process. The inspection process includes selecting the qualified inspection IQI for the predetermined target flaw size. The inspection process also includes performing an inspection test on the qualified inspection IQI using the radiographic inspection system in the selected set-up. The inspection process also includes determining one or more inspection output parameters.
    Type: Grant
    Filed: November 15, 2021
    Date of Patent: April 2, 2024
    Assignee: United States as represented by the Administrator of NASA
    Inventor: Ajay M Koshti
  • Patent number: 11841333
    Abstract: A method for detecting a target flaw using a radiographic inspection system includes selecting a plurality of simulated flaws. The method also includes performing a flaw detection simulation on the simulated flaws. The method also includes determining a plurality of output indication parameters for each of the simulated flaws based at least partially upon the flaw detection simulation. The output indication parameters include a contrast-to-noise ratio (CNR), a resolution ratio, a length-to-width (L/W) indication ratio, and a probability parameter. The method also includes determining a contrast-to-noise ratio sensitivity function (CNR SF) based at least partially upon the output indication parameters. The method also includes qualifying the radiographic inspection system to detect the target flaw based at least partially upon the CNR SF.
    Type: Grant
    Filed: March 9, 2022
    Date of Patent: December 12, 2023
    Inventor: Ajay M Koshti
  • Patent number: 11747287
    Abstract: An image quality indicator (IQI) system includes a crack IQI. The crack IQI includes a penetrameter having a first body and a second body disposed in the first body. The first body has a first body inner surface defining a first body hole. The second body has a second body outer surface disposed adjacent the first body inner surface to form an interface having an interface gap. The IQI system also includes a radiation source spaced from the penetrameter and configured to transmit radiation rays to the penetrameter. The IQI system also includes a radiation detector disposed adjacent the penetrameter and configured to generate an IQI radiographic image indicative of an interface gap characteristic of the interface gap.
    Type: Grant
    Filed: July 9, 2021
    Date of Patent: September 5, 2023
    Inventor: Ajay M Koshti
  • Patent number: 10728426
    Abstract: Methods and systems for analyzing and processing digital data comprising a plurality of infra-red (IR) video images acquired by a pulse thermography system are used to compute video data from the raw and smoothed video data acquired for the performance of non-destructive evaluation. New video data types computed may include but are not limited to contrast evolution data such as normalized contrast, converted contrast and normalized temperature contrast. Additionally, video data types computed comprise surface temperature, surface temperature rise and temperature simple contrast.
    Type: Grant
    Filed: August 16, 2017
    Date of Patent: July 28, 2020
    Assignee: United States of America as represented by the Administrator of the National Aeronautics and Space Administration
    Inventor: Ajay M. Koshti
  • Patent number: 10620133
    Abstract: Methods and systems for analyzing and processing digital data comprising a plurality of infra-red (IR) video images acquired by thermography system are used to compute video data from the raw and smoothed video data acquired for the performance of non-destructive evaluation. New video data types computed may include but are not limited to contrast evolution data such as normalized contrast, converted contrast and normalized temperature contrast. Additionally, video data types computed comprise surface temperature, surface temperature rise and temperature simple contrast.
    Type: Grant
    Filed: March 25, 2019
    Date of Patent: April 14, 2020
    Assignee: United States of America as represented by the Administrator of the National Aeronautics and Space Administration
    Inventor: Ajay M Koshti
  • Patent number: 10332248
    Abstract: Methods and systems for analyzing and processing digital data comprising a plurality of infra-red (IR) video images acquired by a pulse thermography system are used to compute video data from the raw and smoothed video data acquired for the performance of non-destructive evaluation. New video data types computed may include but are not limited to contrast evolution data such as normalized contrast, converted contrast and normalized temperature contrast. Additionally, video data types computed comprise surface temperature, surface temperature rise and temperature simple contrast.
    Type: Grant
    Filed: August 16, 2017
    Date of Patent: June 25, 2019
    Assignee: The United States of America as represented by the Administator of the National Aeronautics and Space Administration
    Inventor: Ajay M. Koshti
  • Patent number: 10242439
    Abstract: Methods and systems for analyzing and processing digital data comprising a plurality of infra-red (IR) video images acquired by a pulse thermography system are used to compute video data from the raw and smoothed video data acquired for the performance of non-destructive evaluation. New video data types computed may include but are not limited to contrast evolution data such as normalized contrast, converted contrast and normalized temperature contrast. Additionally, video data types computed comprise surface temperature, surface temperature rise and temperature simple contrast.
    Type: Grant
    Filed: August 16, 2017
    Date of Patent: March 26, 2019
    Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space Administration
    Inventor: Ajay M. Koshti
  • Patent number: 9787913
    Abstract: Methods and systems for converting an image contrast evolution of an object to a temperature contrast evolution and vice versa are disclosed, including methods for assessing an emissivity of the object; calculating an afterglow heat flux evolution; calculating a measurement region of interest temperature change; calculating a reference region of interest temperature change; calculating a reflection temperature change; calculating the image contrast evolution or the temperature contrast evolution; and converting the image contrast evolution to the temperature contrast evolution or vice versa, respectively.
    Type: Grant
    Filed: June 1, 2015
    Date of Patent: October 10, 2017
    Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space Administration
    Inventor: Ajay M. Koshti
  • Patent number: 9066028
    Abstract: Methods and systems for converting an image contrast evolution of an object to a temperature contrast evolution and vice versa are disclosed, including methods for assessing an emissivity of the object; calculating an afterglow heat flux evolution; calculating a measurement region of interest temperature change; calculating a reference region of interest temperature change; calculating a reflection temperature change; calculating the image contrast evolution or the temperature contrast evolution; and converting the image contrast evolution to the temperature contrast evolution or vice versa, respectively.
    Type: Grant
    Filed: December 17, 2010
    Date of Patent: June 23, 2015
    Assignee: The United States of America as represented by the Administator of the National Aeronautics and Space Administration
    Inventor: Ajay M. Koshti
  • Patent number: 8577120
    Abstract: A method for characterizing an anomaly in a material comprises (a) extracting contrast data; (b) measuring a contrast evolution; (c) filtering the contrast evolution; (d) measuring a peak amplitude of the contrast evolution; (d) determining a diameter and a depth of the anomaly, and (e) repeating the step of determining the diameter and the depth of the anomaly until a change in the estimate of the depth is less than a set value. The step of determining the diameter and the depth of the anomaly comprises estimating the depth using a diameter constant CD equal to one for the first iteration of determining the diameter and the depth; estimating the diameter; and comparing the estimate of the depth of the anomaly after each iteration of estimating to the prior estimate of the depth to calculate the change in the estimate of the depth of the anomaly.
    Type: Grant
    Filed: October 8, 2010
    Date of Patent: November 5, 2013
    Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space Administration
    Inventor: Ajay M. Koshti