Patents by Inventor Ajay Pasupuleti

Ajay Pasupuleti has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230394415
    Abstract: Systems and methods for Non-Destructive Evaluation (NDE) are described. The NDE system comprises of a platform with inspection, audit and simulator modules running on a cloud-based server. The platform facilitates non-destructive evaluation of objects or parts for manufacturing defects by industry experts. The platform connects project owners and experts for NDE over a secure communication channel. Experts are qualified by the system. The system provides for training on different scan methods using a simulator.
    Type: Application
    Filed: June 1, 2023
    Publication date: December 7, 2023
    Inventors: Ajay Pasupuleti, Igor Kasovski, Michael L. Turnbow, Dale Lynn
  • Patent number: 9740728
    Abstract: Systems and methods are disclosed for tracking the conversion of data from a hardcopy or physical format such as radiograph film to electronic format such as DICONDE format. The method provides the capability of automatic consistency checks of image quality generated by the digitizer as well as allows for process quality checks by users. Authentication and authorization is built into the digitization process to allow access to authorized users for a particular task. The system provides the capability to generate statistical process control (SPC) curves and reports of the consistency checks. Disaster recovery capability is built into the system.
    Type: Grant
    Filed: October 13, 2014
    Date of Patent: August 22, 2017
    Assignee: NANOARK CORPORATION
    Inventors: Vanditha Mukund, Ajay Pasupuleti
  • Publication number: 20150106885
    Abstract: Systems and methods are disclosed for tracking the conversion of data from a hardcopy or physical format such as radiograph film to electronic format such as DICONDE format. The method provides the capability of automatic consistency checks of image quality generated by the digitizer as well as allows for process quality checks by users. Authentication and authorization is built into the digitization process to allow access to authorized users for a particular task. The system provides the capability to generate statistical process control (SPC) curves and reports of the consistency checks. Disaster recovery capability is built into the system.
    Type: Application
    Filed: October 13, 2014
    Publication date: April 16, 2015
    Inventors: Vanditha Mukund, Ajay Pasupuleti
  • Publication number: 20120236369
    Abstract: A system for the long-term storage and high-speed retrieval of color images stored on semiconductor substrates. The images are stored on semiconductor substrates by utilizing semiconductor fabrication techniques to produce a plurality of images. A transparent thin-film dielectric varies in thickness to product a color palette.
    Type: Application
    Filed: March 26, 2012
    Publication date: September 20, 2012
    Applicant: Nanoark Corporation
    Inventor: Ajay Pasupuleti
  • Patent number: 8155427
    Abstract: A system for the long-term storage and high-speed retrieval of images stored on silicon wafers. The images are stored by utilizing semiconductor fabrication techniques. These images are organized and managed using metadata in the form of a barcode. Each barcode is a unique identifier that contains the location information for each specific image on the silicon wafer substrate. The system further provides an identifier in an electronic database that references the appropriate barcode and describes the contents of the image. The images and barcodes are transferred to specific predetermined locations on the silicon wafer. The stored images are retrieved by use of a software program that searches for a user's queries in the electronic database and outputs the specific barcode to the image reader. The image reader translates the barcode information for the desired image and drives the optics or the silicon wafer to the appropriate location.
    Type: Grant
    Filed: December 14, 2007
    Date of Patent: April 10, 2012
    Assignee: Nanoark Corporation
    Inventor: Ajay Pasupuleti
  • Publication number: 20080170775
    Abstract: A system for the long-term storage and high-speed retrieval of images stored on silicon wafers. The images are stored by utilizing semiconductor fabrication techniques. These images are organized and managed using metadata in the form of a barcode. Each barcode is a unique identifier that contains the location information for each specific image on the silicon wafer substrate. The system further provides an identifier in an electronic database that references the appropriate barcode and describes the contents of the image. The images and barcodes are transferred to specific predetermined locations on the silicon wafer. The stored images are retrieved by use of a software program that searches for a user's queries in the electronic database and outputs the specific barcode to the image reader. The image reader translates the barcode information for the desired image and drives the optics or the silicon wafer to the appropriate location.
    Type: Application
    Filed: December 14, 2007
    Publication date: July 17, 2008
    Inventor: Ajay Pasupuleti