Abstract: A testing device is for detecting a short circuit condition in a DUT. The testing device includes a drive electrode to be coupled to the DUT, a sensing electrode to be coupled to the DUT, and a testing probe to be selectively coupled to locations on the DUT. The testing device also includes a controller unit coupled to the drive electrode, the sensing electrode, and the testing probe. The controller unit is configured to generate an AC current source signal at the drive electrode, at the testing probe, detect voltage signals for the locations on the DUT, and determine a given location on the DUT to be adjacent to the short circuit condition based upon voltage signals for the locations on the DUT.