Abstract: An apparatus for reducing test time is disclosed. The apparatus includes a processor operable to execute one or more modules to cause the processor to receive operational parameters associated with a first scan chain grouping circuitry and a second scan chain grouping circuitry of an integrated circuit design. The operational parameters include a number of initialization cycles of a first test signal selected for the first scan chain grouping circuitry, a number of initialization cycles of a second test signal selected for the second scan chain grouping circuitry, and a sum for a total number of cycles for the first test signal. The processor also determines a scan chain length for one of the first scan chain grouping circuitry or the second scan chain grouping circuitry based upon the operation parameters such that the total number of cycles of the first signal and the second signal are the same.