Patents by Inventor Ajit Achuthan
Ajit Achuthan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20260002851Abstract: A method, apparatus, and software for an in-situ mechanical testing system to characterize heterogeneous deformation at microscale are disclosed. The current intellectual property landscape shows the in-situ mechanical testing of metals and alloys is severely limited to a maximum of about 1% macroscopic strain due to the optical microscopy's low depth of focus. To address this challenge, we disclose a smart imaging system consisting of several novel techniques. The techniques include digitally enhanced effective depth of field, real-time targeting and maintaining of a region of interest to image within the field of view and focus, and a panoramic imaging method to digitally widen the field of view. We also disclose a deformation quantification subsystem to analyze the collected data and quantify deformation characteristics. Finally, an expert system to extract the influence of microstructural features on the elastic-plastic and fracture properties is also disclosed.Type: ApplicationFiled: June 27, 2024Publication date: January 1, 2026Applicant: CLARKSON UNIVERSITYInventors: Ajit Achuthan, Natasha K. Banerjee, Sean Banerjee, Janith Wanni, Kavindu Wijesinghe
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Publication number: 20160355904Abstract: A device for additive manufacturing of an object. The device includes: a first probe configured to form the object; and a work-hardening second probe, where the work-hardening second probe is an ultrasonic probe, and further where the second probe is configured to emit ultrasonic energy to modify a substructure of the object during manufacture; wherein the first probe is configured to increase a temperature of at least a portion of a first layer of the object facing the first probe, to a first depth; and wherein the second probe is configured to work-harden the at least a portion of the first layer of the object facing the first probe, to a second depth, the second depth being greater than the first depth.Type: ApplicationFiled: June 2, 2016Publication date: December 8, 2016Applicant: Clarkson UniversityInventors: Ajit Achuthan, Joshua D. Gale
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Patent number: 7652586Abstract: According to one embodiment, a first capacitive element may be provided and associated with a surface where a fouling layer is to be detected. A second capacitive element may also be provided, and a capacitance between the first and second capacitive elements may be used to detect formation of the fouling layer. According to another embodiment, a thermal device is provided proximate to a surface where a fouling layer is to be detected. A detector (e.g., a thermometer or vibration detector) may detect a condition associated with the surface, and formation of the fouling layer may be determined based at least in part on the condition.Type: GrantFiled: August 15, 2006Date of Patent: January 26, 2010Assignee: General Electric CompanyInventors: Marko Baller, Marcin Alexy, Glenn S. Claydon, Peter Joseph Codella, Stacey Kennerly, Kuna Kishore, Anis Zribi, Guiju Song, Shivappa Goravar, Ajit Achuthan
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Patent number: 7633725Abstract: A system is presented. The system includes detection circuitry configured to detect occurrence of a zero crossing of an alternating source voltage or an alternating load current. The system also includes switching circuitry coupled to the detection circuitry and comprising a micro-electromechanical system switch. Additionally, the system includes control circuitry coupled to the detection circuitry and the switching circuitry and configured to perform arc-less switching of the micro-electromechanical system switch responsive to a detected zero crossing of an alternating source voltage or alternating load current.Type: GrantFiled: December 20, 2005Date of Patent: December 15, 2009Assignee: General Electric CompanyInventors: William James Premerlani, Kanakasabapathi Subramanian, Christopher Keimel, John N. Park, Ajit Achuthan, Wensen Wang, Joshua Isaac Wright, Kristina Margaret Korosi, Somashekhar Basavaraj
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Patent number: 7495227Abstract: An x-ray detector is provided for use in imaging systems. The x-ray detector includes a detector subsystem configured to output electrical signals in response to reception of x-rays. The detector subsystem includes an imaging panel, a support layer and a low density core disposed between the imaging panel and the support layer.Type: GrantFiled: July 10, 2007Date of Patent: February 24, 2009Assignee: General Electric CompanyInventors: William Andrew Hennessy, Habib Vafi, Donald Earl Castleberry, Michael John Utschig, Mahadevan Balasubramaniam, Jie Jiang, Virendra Vilas Gaikwad, Ajit Achuthan, Le Yan
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Publication number: 20090014659Abstract: An x-ray detector is provided for use in imaging systems. The x-ray detector includes a detector subsystem configured to output electrical signals in response to reception of x-rays. The detector subsystem includes an imaging panel, a support layer and a low density core disposed between the imaging panel and the support layer.Type: ApplicationFiled: July 10, 2007Publication date: January 15, 2009Applicant: GENERAL ELECTRIC COMPANYInventors: William Andrew Hennessy, Habib Vafi, Donald Earl Castleberry, Michael John Utschig, Mahadevan Balasubramaniam, Jie Jiang, Virendra Vilas Gaikwad, Ajit Achuthan, Le Yan
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Patent number: 7428055Abstract: A interferometer-based fouling detection system and method are described. The system may include a fiber optic cable, a light source in communication with the fiber optic cable, at least one photo detector in communication with the fiber optic cable, and at least one interferometric spectrometer. The fiber optic cable may include a long period grating and a fiber Bragg grating or it may include a facet edge. The system may instead include a fiber optic cable, a light source in communication with the fiber optic cable, at least one photo detector in communication with the fiber optic cable, a fiber coupler, a reference probe including a mirror, a sample probe, and an interferometer.Type: GrantFiled: October 5, 2006Date of Patent: September 23, 2008Assignee: General Electric CompanyInventors: Anis Zribi, Min-Yi Shih, Guiju Song, Ajit Achuthan, Glenn Scott Claydon, Stacey Joy Kennerly, Kuna Venkat Satya Rama Kishore, Jianming Zheng, Kevin George Harding, Hua Xia
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Publication number: 20080084565Abstract: A interferometer-based fouling detection system and method are described. The system may include a fiber optic cable, a light source in communication with the fiber optic cable, at least one photo detector in communication with the fiber optic cable, and at least one interferometric spectrometer. The fiber optic cable may include a long period grating and a fiber Bragg grating or it may include a facet edge. The system may instead include a fiber optic cable, a light source in communication with the fiber optic cable, at least one photo detector in communication with the fiber optic cable, a fiber coupler, a reference probe including a mirror, a sample probe, and an interferometer.Type: ApplicationFiled: October 5, 2006Publication date: April 10, 2008Applicant: GENERAL ELECTRIC COMPANYInventors: Anis Zribi, Min-Yi Shih, Guiju Song, Ajit Achuthan, Glenn Scott Claydon, Stacey Joy Kennerly, Kuna Venkat Satya Rama Kishore, Jianming Zheng, Kevin George Harding, Hua Xia
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Publication number: 20080041139Abstract: According to one embodiment, a first capacitive element may be provided and associated with a surface where a fouling layer is to be detected. A second capacitive element may also be provided, and a capacitance between the first and second capacitive elements may be used to detect formation of the fouling layer. According to another embodiment, a thermal device is provided proximate to a surface where a fouling layer is to be detected. A detector (e.g., a thermometer or vibration detector) may detect a condition associated with the surface, and formation of the fouling layer may be determined based at least in part on the condition.Type: ApplicationFiled: August 15, 2006Publication date: February 21, 2008Inventors: Marko Baller, Marcin Alexy, Glenn S. Claydon, Peter Joseph Codella, Stacey Kennerly, Kuna Kishore, Anis Zribi, Guiju Song, Shivappa Goravar, Ajit Achuthan
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Publication number: 20070139829Abstract: A system is presented. The system includes a first micro-electromechanical system switch. Further, the system includes arc suppression circuitry coupled to the first micro-electromechanical system switch, wherein the arc suppression circuitry comprises a balanced diode bridge and is configured to facilitate suppression of an arc formation between contacts of the first micro-electromechanical system switch.Type: ApplicationFiled: December 20, 2005Publication date: June 21, 2007Inventors: Stephen Arthur, Kanakasabapathi Subramanian, William Premerlani, John Park, Ajit Achuthan, Wensen Wang, Joshua Wright, Kristina Korosi, Somashekhar Basavaraj
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Publication number: 20070139830Abstract: A system is presented. The system includes detection circuitry configured to detect occurrence of a zero crossing of an alternating source voltage or an alternating load current. The system also includes switching circuitry coupled to the detection circuitry and comprising a micro-electromechanical system switch. Additionally, the system includes control circuitry coupled to the detection circuitry and the switching circuitry and configured to perform arc-less switching of the micro-electromechanical system switch responsive to a detected zero crossing of an alternating source voltage or alternating load current.Type: ApplicationFiled: December 20, 2005Publication date: June 21, 2007Inventors: William Premerlani, Kanakasabapathi Subramanian, Christopher Keimel, John Park, Ajit Achuthan, Wensen Wang, Joshua Wright, Kristina Korosi, Somashekhar Basavaraj