Patents by Inventor Ajit Dubey

Ajit Dubey has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240125500
    Abstract: A monitoring system is configured to monitor an environment within an enclosure of a heating, ventilation, air conditioning, and/or refrigeration (HVAC&R) system. The monitoring system includes a sensor configured to acquire data indicative of an environmental parameter value within the enclosure. The monitoring system also includes a controller configured to receive the data from the sensor, to determine occurrence of a thermal event within the enclosure based on the data, and to instruct a circuit breaker of the HVAC&R system to transition to a fault configuration in response to determining the occurrence of the thermal event.
    Type: Application
    Filed: February 18, 2022
    Publication date: April 18, 2024
    Inventors: Michael Scott Todd, Ajit Wasant Kane, Karl Richard Barley, Kanishk Dubey, Haidong Yu, JonPaul Warriner, Simon Ho
  • Patent number: 7052968
    Abstract: In a method and system for placing an IC (integrated circuit) die onto a package substrate, a first reference is determined after locating a first fiducial on the package substrate, and a second reference is determined after locating a second fiducial on the package substrate. The IC die is placed onto the package substrate to be aligned with respect to the first and second references of the first and second fiducials that are comprised of a plurality of markings such as a plurality of dots.
    Type: Grant
    Filed: April 7, 2004
    Date of Patent: May 30, 2006
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Swee Peng Lee, Ajit Dubey
  • Patent number: 7030772
    Abstract: In a method and system for inspecting alignment between an IC (integrated circuit) die and a package substrate, a plurality of fiducials are located on the package substrate for determining a plurality of references. A center point of the package substrate is determined from the plurality of references. In addition, whether a center point of the IC die is aligned to the center point of the package substrate within an acceptable range is determined.
    Type: Grant
    Filed: April 7, 2004
    Date of Patent: April 18, 2006
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Swee Peng Lee, Ajit Dubey, Leang Hua Kam, Loo Kean Teoh