Patents by Inventor Ajit Krishnan

Ajit Krishnan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7638036
    Abstract: Nanosensors for detecting analytes and methods of detecting analytes have been developed in which the redox potential of a redox effector in solution is altered thereby causing changes in carbon nanotube conductance. The analyte may be detected in solution, eliminating the need for immobilizing the analyte on a support.
    Type: Grant
    Filed: September 30, 2005
    Date of Patent: December 29, 2009
    Assignee: E. I. du Pont de Nemours and Company
    Inventors: Salah Boussaad, Bruce A. Diner, Janine Fan, Vsevolod Rostovtsev, Ajit Krishnan
  • Patent number: 7635423
    Abstract: This invention relates to the field of nanotechnology. Specifically the invention describes a nanosensor for the detection of an analyte in which the redox potential in solution is altered thereby causing changes in carbon nanotube conductance.
    Type: Grant
    Filed: September 30, 2005
    Date of Patent: December 22, 2009
    Assignee: E. I. du Pont de Nemours and Company
    Inventors: Salah Boussaad, Bruce A. Diner, Janine Fan, Vsevolod Rostovtsev, Ajit Krishnan
  • Publication number: 20070278111
    Abstract: This invention relates to the field of nanotechnology. Specifically the invention describes a nanosensor for the detection of an analyte in which the redox potential in solution is altered thereby causing changes in carbon nanotube conductance.
    Type: Application
    Filed: September 30, 2005
    Publication date: December 6, 2007
    Inventors: Salah Boussaad, Bruce Diner, Janine Fan, Vsevolod Rostovtsev, Ajit Krishnan
  • Publication number: 20070227906
    Abstract: Nanosensors for detecting analytes and methods of detecting analytes have been developed in which the redox potential of a redox effector in solution is altered thereby causing changes in carbon nanotube conductance. The analyte may be detected in solution, eliminating the need for immobilizing the analyte on a support.
    Type: Application
    Filed: September 30, 2005
    Publication date: October 4, 2007
    Inventors: Salah Boussaad, Bruce Diner, Janine Fan, Vsevolod Rostovtsev, Ajit Krishnan
  • Publication number: 20030234358
    Abstract: A piezo-noise microscope for use in examining a sample of piezoelectric material is provided. The piezo-noise microscope improves on existing atomic force microscope (AFM) techniques by generating piezoresponse noise signals which are useful for determining the long-term polarization stability of piezoelectric materials, and in particular ferroelectric materials, without the need to make repeated observations over extended periods of time. A method for detecting piezo-response noise in a sample of piezoelectric material using a piezo-noise microscope, and a method for detecting the stability of polarization in regions of a sample of piezoelectric material, are also provided.
    Type: Application
    Filed: July 31, 2002
    Publication date: December 25, 2003
    Applicant: NEC Research Institute, Inc.
    Inventors: Mark J. Higgins, Sabyasachi Bhattacharya, Ajit Krishnan
  • Patent number: 6392919
    Abstract: A method for reducing imprint in a ferroelectric device which includes the steps of: applying a signal having a bipolar pulse shape for a predetermined time to the ferroelectric device; and decreasing the signal amplitude gradually in predetermined intervals of time and amplitude. Preferably, the bipolar shape signal is a sinusoidal wave, a square wave, or a sawtooth wave and the ferroelectric device is a capacitor of a memory cell in a computer. Also provided is an apparatus for reducing imprint in a ferroelectric device.
    Type: Grant
    Filed: May 14, 2001
    Date of Patent: May 21, 2002
    Assignee: NEC Research Institute, Inc.
    Inventors: Mark J. Higgins, Ajit Krishnan, Sabyasachi Bhattacharya, Michael M. J. Treacy
  • Patent number: 6294393
    Abstract: A method for reducing imprint in a ferroelectric device which includes the steps of: applying a signal having a bipolar pulse shape for a predetermined time to the ferroelectric device; and decreasing the signal amplitude gradually in predetermined intervals of time and amplitude. Preferably, the bipolar shape signal is a sinusoidal wave, a square wave, or a sawtooth wave and the ferroelectric device is a capacitor or a memory cell in a computer. Also provided is an apparatus for reducing imprint in a ferroelectric device.
    Type: Grant
    Filed: August 23, 2000
    Date of Patent: September 25, 2001
    Assignee: NEC Research Institute, Inc.
    Inventors: Mark J. Higgins, Ajit Krishnan, Sabyasachi Bhattacharya, Michael M. J. Treacy
  • Patent number: 6285020
    Abstract: An apparatus for enhanced light transmission through a perforated metal film is provided. The apparatus comprises a metal film having a first surface and a second surface, at least one aperture provided in the metal film and extending from the first surface to the second surface, and first and second dielectric layers. The first dielectric layer is provided substantially adjacent to the first metal film surface, and the second dielectric layer is provided substantially adjacent to the second metal film surface. The respective refractive indices of the first and second dielectric layers are substantially equal. Light incident on one of the surfaces of the metal film interacts with a surface plasmon mode on at least one of the surfaces of the metal film thereby enhancing transmission of light through the at least one aperture in the metal film.
    Type: Grant
    Filed: November 5, 1999
    Date of Patent: September 4, 2001
    Assignee: NEC Research Institute, Inc.
    Inventors: Tae Jin Kim, Ajit Krishnan, Tineke Thio, Henri Joseph Lezec, Thomas W. Ebbesen