Abstract: Systems and methods for adjusting yield values for crops based on scan data associated with the crops are provided. One example computer-implemented method includes initially classifying data points of a composite data set into one of a ground class and a vegetation class. The method also includes determining a canopy height model (CHM) for the plot based on the classified composite data set, where the CHM includes at least one of the data points classified in the vegetation class, and computing a plant height for the plot based on the CHM. The method further includes determining a neighboring plant height difference based on the plant height for the plot and a plant height for each of at least one neighboring plot to said plot, computing a yield adjustment based on the determined neighboring plant height difference(s), and determining a plot yield for the plot, based on the yield adjustment.

Abstract: A crop stand analyzer includes a first plurality of reflective laser proximity sensors, the reflective laser proximity sensors arranged in a vertical row and perpendicularly to a ground surface to detect plant objects, a distance sensor, and a processor operatively connected to the first plurality of reflective laser proximity sensors and the distance sensor. The crop stand analyzer is configured to generate side-view profiles for the plant objects and then extract plant stand information via these profiles.